skip to main content
Refinado por: assunto: Mustererkennung remover
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2004 and SPR 2004, Lisbon, Portugal, August 18-20, 2004 Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2004 and SPR 2004, Lisbon, Portugal, August 18-20, 2004 Proceedings

Fred, Ana ; Caelli, Terry ; Duin, Robert P. W ; Campilho, Aurélio ; Ridder, Dick de Campilho, Aurélio C. ; de Ridder, Dick ; Caelli, Terry M. ; Fred, Ana ; Duin, Robert P. W.

Berlin, Heidelberg: Springer Berlin / Heidelberg 2004

Texto completo disponível

2
Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002. Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops SSPR 2002 and SPR 2002, Windsor, Ontario, Canada, August 6-9, 2002. Proceedings

Caelli, Terry ; Amin, Adnan ; Duin, Robert P.W ; Kamel, Mohamed ; Ridder, Dick de Amin, Adnan ; Caelli, Terry ; de Ridder, Dick ; Duin, Robert P. W. ; Kamel, Mohamed

Berlin, Heidelberg: Springer Berlin / Heidelberg 2002

Texto completo disponível

3
Advances in Pattern Recognition: Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Advances in Pattern Recognition: Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings

Ferri, Francesc J ; Inesta, Jose M ; Amin, Adnan ; Pudil, Pavel Amin, Adnan ; Iñesta, José M. ; Ferri, Francesc J. ; Pudil, Pavel

Berlin, Heidelberg: Springer Berlin / Heidelberg 2000

Texto completo disponível

4
Graph Based Representations in Pattern Recognition: 4th IAPR International Workshop, GbRPR 2003, York, UK, June 30 - July 2, 2003. Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Graph Based Representations in Pattern Recognition: 4th IAPR International Workshop, GbRPR 2003, York, UK, June 30 - July 2, 2003. Proceedings

Hancock, Edwin ; Vento, Mario Vento, Mario ; Hancock, Edwin

Berlin, Heidelberg: Springer Berlin / Heidelberg 2003

Texto completo disponível

5
Advances in Pattern Recognition: Joint IAPR International Workshops SSPR'98 and SPR'98 Sydney, Australia, August 11–13, 1998 Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Advances in Pattern Recognition: Joint IAPR International Workshops SSPR'98 and SPR'98 Sydney, Australia, August 11–13, 1998 Proceedings

Amin, Adnan ; Dori, Dov ; Pudil, Pavel ; Freeman, Herbert Pudil, Pavel ; Dori, Dov ; Freeman, Herbert ; Amin, Adnan

Berlin, Heidelberg: Springer Berlin Heidelberg 1998

Texto completo disponível

6
Graphics Recognition. Recent Advances and Perspectives: 5th International Workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003, Revised Selected Papers
Material Type:
Livro
Adicionar ao Meu Espaço

Graphics Recognition. Recent Advances and Perspectives: 5th International Workshop, GREC 2003, Barcelona, Spain, July 30-31, 2003, Revised Selected Papers

Lladós, Josep ; Kwon, Young-Bin Lladós, Josep ; Kwon, Young-Bin

Berlin, Heidelberg: Springer Berlin Heidelberg 2004

Texto completo disponível

7
Biometric Authentication: First International Conference, ICBA 2004, Hong Kong, China, July 15-17, 2004, Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Biometric Authentication: First International Conference, ICBA 2004, Hong Kong, China, July 15-17, 2004, Proceedings

Zhang, David Y ; Jain, Anil K Jain, Anil K. ; Zhang, David

Berlin, Heidelberg: Springer Berlin / Heidelberg 2004

Texto completo disponível

8
Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings

änti, Pasi ; Brown, Gavin ; Loog, Marco ; Escolano, Francisco ; Pelillo, Marcello Escolano, Francisco ; Brown, Gavin ; Fr'nti, Pasi ; Loog, Marco

Berlin, Heidelberg: Springer Nature 2014

Texto completo disponível

9
Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2012, Hiroshima, Japan, November 7-9, 2012, Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2012, Hiroshima, Japan, November 7-9, 2012, Proceedings

Gimel´farb, Georgy ; Hancock, Edwin ; Imiya, Atsushi ; Kuijper, Arjan ; Kudo, Mineichi ; Omachi, Shinichiro ; Windeatt, Terry ; Yamada, Keiji Kuijper, Arjan ; Imiya, Atsushi ; Gimel�´farb, Georgy ; Hancock, Edwin

Netherlands: Springer Nature 2012

Texto completo disponível

10
Artificial Neural Networks in Pattern Recognition: 6th IAPR TC 3 International Workshop, ANNPR 2014, Montreal, QC, Canada, October 6-8, 2014, Proceedings
Material Type:
Livro
Adicionar ao Meu Espaço

Artificial Neural Networks in Pattern Recognition: 6th IAPR TC 3 International Workshop, ANNPR 2014, Montreal, QC, Canada, October 6-8, 2014, Proceedings

El Gayar, Neamat ; Schwenker, Friedhelm ; Suen, Ching Y Suen, Cheng ; El Gayar, Neamat ; Schwenker, Friedhelm

Cham: Springer Nature 2014

Texto completo disponível

Personalize Seus Resultados

  1. Editar

Refine Search Results

Expandir Meus Resultados

  1.   

Mostrar Somente

  1. Recursos Online (14)
  2. Revistas revisadas por pares (9)

Refinar Meus Resultados

Tipo de Recurso 

  1. Livros  (15)
  2. Anais de Congresso  (2)
  3. Mais opções open sub menu

Data de Publicação 

De até
  1. Antes de2000  (2)
  2. 2000Até2002  (3)
  3. 2003Até2004  (6)
  4. 2005Até2007  (5)
  5. Após 2007  (8)
  6. Mais opções open sub menu

Buscando em bases de dados remotas. Favor aguardar.