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Refinado por: Nome da Publicação: Gettering And Defect Engineering In Semiconductor Technology Xii remover assunto: Materials Science, Multidisciplinary remover assunto: Physics remover
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1
Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy
Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy
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Hydrogenated Nanocrystalline Silicon Thin Films Studied by Scanning Force Microscopy

Cavalcoli, Daniela ; Cavallini, Anna ; Tomasi, Andrea ; Rossi, Marco ; Isella, Giovanni ; Chrastina, Danny

Solid state phenomena, 2008-01, Vol.131-133, p.547-552 [Periódico revisado por pares]

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2
A Comparative Analysis of Structural Defect Formation in Si+ Implanted and then Plasma Hydrogenated and in H+ Implanted Crystalline Silicon
A Comparative Analysis of Structural Defect Formation in Si+ Implanted and then Plasma Hydrogenated and in H+ Implanted Crystalline Silicon
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A Comparative Analysis of Structural Defect Formation in Si+ Implanted and then Plasma Hydrogenated and in H+ Implanted Crystalline Silicon

Nordmark, Heidi ; Ulyashin, Alexander G. ; Holmestad, Randi ; Walmsley, John Charles

Solid state phenomena, 2008-01, Vol.131-133, p.309-314 [Periódico revisado por pares]

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3
Study of Gettering Mechanisms in Silicon: Competitive Gettering between Phosphorus Diffusion Gettering and Other Gettering Sites
Study of Gettering Mechanisms in Silicon: Competitive Gettering between Phosphorus Diffusion Gettering and Other Gettering Sites
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Study of Gettering Mechanisms in Silicon: Competitive Gettering between Phosphorus Diffusion Gettering and Other Gettering Sites

Yamashita, T. ; Shabani, Mohammad B. ; Morita, E.

Solid state phenomena, 2008-01, Vol.131-133, p.399-404 [Periódico revisado por pares]

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4
Electrical Uniformity of Direct Silicon Bonded Wafer Interfaces
Electrical Uniformity of Direct Silicon Bonded Wafer Interfaces
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Electrical Uniformity of Direct Silicon Bonded Wafer Interfaces

Zhao, W. ; Ries, M. ; Wagener, Magnus C. ; Rozgonyi, George A. ; Zhang, R.H. ; Seacrist, M.

Solid state phenomena, 2008-01, Vol.131-133, p.321-326 [Periódico revisado por pares]

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5
Two Paths of Oxide Precipitate Nucleation in Silicon
Two Paths of Oxide Precipitate Nucleation in Silicon
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Two Paths of Oxide Precipitate Nucleation in Silicon

Kissinger, G. ; Dabrowski, J. ; Müller, Timo ; Sattler, Andreas ; von Ammon, Wilfried

Solid state phenomena, 2008-01, Vol.131-133, p.293-302 [Periódico revisado por pares]

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6
Internal Dissolution of Buried Oxide in SOI Wafers
Internal Dissolution of Buried Oxide in SOI Wafers
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Internal Dissolution of Buried Oxide in SOI Wafers

Kononchuk, Oleg ; Allibert, Frederic ; Boedt, Francois

Solid state phenomena, 2008-01, Vol.131-133, p.113-118 [Periódico revisado por pares]

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7
Impact of Iron and Molybdenum in Mono and Multicrystalline Float-Zone Silicon Solar Cells
Impact of Iron and Molybdenum in Mono and Multicrystalline Float-Zone Silicon Solar Cells
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Impact of Iron and Molybdenum in Mono and Multicrystalline Float-Zone Silicon Solar Cells

Riepe, Stephan ; Arumughan, J. ; Geerligs, L.J. ; Warta, Wilhelm ; Manshanden, P. ; Coletti, Gianluca ; Kopecek, R. ; Swanson, C.

Solid state phenomena, 2008-01, Vol.131-133, p.15-20 [Periódico revisado por pares]

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8
Influence of the Dislocation Travel Distance on the DLTS Spectra of Dislocations in Cz-Si
Influence of the Dislocation Travel Distance on the DLTS Spectra of Dislocations in Cz-Si
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Influence of the Dislocation Travel Distance on the DLTS Spectra of Dislocations in Cz-Si

Seibt, Michael ; Kveder, Vitaly V. ; Khorosheva, M. ; Orlov, Valeri I.

Solid state phenomena, 2008-01, Vol.131-133, p.175-182 [Periódico revisado por pares]

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9
Advances in Structural Characterization of Thin Film Nanocrystalline Silicon for Photovoltaic Applications
Advances in Structural Characterization of Thin Film Nanocrystalline Silicon for Photovoltaic Applications
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Advances in Structural Characterization of Thin Film Nanocrystalline Silicon for Photovoltaic Applications

Binetti, Simona ; Texier, Michael ; Isella, Giovanni ; Pichaud, Bernard ; Le Donne, Alessia ; Pizzini, Sergio ; Acciarri, Maurizio

Solid state phenomena, 2008-01, Vol.131-133, p.33-38 [Periódico revisado por pares]

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10
Investigation of the Temperature Degradation and Re-Activation of the Luminescent Centres in Rare Earth Implanted SiO2 Layers
Investigation of the Temperature Degradation and Re-Activation of the Luminescent Centres in Rare Earth Implanted SiO2 Layers
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Investigation of the Temperature Degradation and Re-Activation of the Luminescent Centres in Rare Earth Implanted SiO2 Layers

Rebohle, L. ; Prucnal, S. ; Skorupa, Wolfgang

Solid state phenomena, 2008-01, Vol.131-133, p.595-600 [Periódico revisado por pares]

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