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Refinado por: tipo de recurso: Anais de Congresso remover
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1
Using OES to measurement of electron temperature of SF6/Ar gas mixture of ICP discharges
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Using OES to measurement of electron temperature of SF6/Ar gas mixture of ICP discharges

Osipov, Artem A ; Osipov, Armenak A ; Berezenko, Vladimir I ; Alexandrov, Sergey E

Journal of physics. Conference series, 2020, Vol.1679 (2) [Periódico revisado por pares]

IOP Publishing

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2
He+2 molecular ions in helium glow discharges : the effect of bulk electron temperature
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He+2 molecular ions in helium glow discharges : the effect of bulk electron temperature

KUTASI, Kinga ; HARTMANN, Péter ; BANO, Gergely ; DONKO, Zoltan

Plasma sources science & technology (Print), 2005, Vol.14 (2), p.S1-S8 [Periódico revisado por pares]

Bristol: Institute of Physics

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3
Radial localization of electron temperature pedestal and ELM-like events using ECE measurements at Wendelstein 7-X
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Radial localization of electron temperature pedestal and ELM-like events using ECE measurements at Wendelstein 7-X

Chaudhary, N. ; Hirsch, M. ; Andreeva, T. ; Geiger, J. ; Hoefel, U. ; Rahbarnia, K. ; Wurden, Glen Anthony ; Wolf, R. C. ; Team, Wendelstein

United States 2022

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4
Measurements of electron temperature, and ion density, in a mixture of O 2 and Ar plasma
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Measurements of electron temperature, and ion density, in a mixture of O 2 and Ar plasma

Reyes, P G ; Mendez, E ; Osorio-González, D ; Castillo, F ; Martínez, H

Journal of physics. Conference series, 2010, Vol.207, p.12020 [Periódico revisado por pares]

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5
Statistical modeling of deconvolution procedures for improving the resolution of measuring electron temperature profiles in tokamak plasmas by Thomson scattering lidar
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Statistical modeling of deconvolution procedures for improving the resolution of measuring electron temperature profiles in tokamak plasmas by Thomson scattering lidar

DREISCHUH, Tanja N ; GURDEV, Ljuan L ; STOYANOV, Dimitar V

Proceedings of SPIE, the International Society for Optical Engineering, 2011, Vol.7747

Bellingham, Wash: SPIE

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6
Feasibility of moiré deflectometry for measuring temperature and electron number density of rocket exhaust plume
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Feasibility of moiré deflectometry for measuring temperature and electron number density of rocket exhaust plume

Chen, Yun-yun ; Song, Yang ; Li, Zhen-hua ; He, An-zhi

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7848, p.78480B-78480B-10

Bellingham, Wash: SPIE

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7
Modeling of electron temperature and DC bias voltage in an inductively-coupled Cl2/Ar plasma using neural network
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Modeling of electron temperature and DC bias voltage in an inductively-coupled Cl2/Ar plasma using neural network

MOONKEUN KIM ; HANBYEOL JANG ; LEE, Yong-Hwa ; KWON, Kwang-Ho ; PARK, Kang-Bak

Surface & coatings technology, 2013, Vol.231, p.546-549 [Periódico revisado por pares]

Amsterdam: Elsevier

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8
Spin-resolved pair-correlation functions of quasi one dimensional electron gas at finite temperature
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Spin-resolved pair-correlation functions of quasi one dimensional electron gas at finite temperature

Kaur, Kulveer ; Sharma, Akariti ; Garg, Vinayak ; Moudgil, R.K.

Materials today : proceedings, 2020, Vol.26, p.3426-3428 [Periódico revisado por pares]

Elsevier Ltd

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9
Effects of temperature, thickness, electron density and defect density on ZnS based solar cells: SCAPS-1D simulation
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Effects of temperature, thickness, electron density and defect density on ZnS based solar cells: SCAPS-1D simulation

Talbi, Abdelali ; Khaaissa, Yassine ; Nouneh, Khalid ; Mustapha Feddi, El ; El Haouari, Mohamed

Materials today : proceedings, 2022, Vol.66, p.116-121 [Periódico revisado por pares]

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10
Measurement of extreme ultraviolet (EUV) and the electron temperature for relative electron density ratio using stark broadening of the coaxial focused plasma
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Measurement of extreme ultraviolet (EUV) and the electron temperature for relative electron density ratio using stark broadening of the coaxial focused plasma

Young June Hong ; Sung Hee Lee ; Eun Ha Choi

2010 Abstracts IEEE International Conference on Plasma Science, 2010, p.1-1

IEEE

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