Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Thin film organic photodetectors for indirect X-ray detection demonstrating low dose rate sensitivity at low voltage operationStarkenburg, Daken J. ; Johns, Paul M. ; Baciak, James E. ; Nino, Juan C. ; Xue, JiangengJournal of applied physics, 2017-12, Vol.122 (22) [Periódico revisado por pares]United States: American Institute of Physics (AIP)Texto completo disponível |
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2 |
Material Type: Artigo
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GaN based nanorods for solid state lightingLi, Shunfeng ; Waag, AndreasJournal of applied physics, 2012-04, Vol.111 (7), p.071101-071101-23 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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3 |
Material Type: Artigo
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A comparison of point defects in Cd1−xZnxTe1−ySey crystals grown by Bridgman and traveling heater methodsGul, R. ; Roy, U. N. ; Camarda, G. S. ; Hossain, A. ; Yang, G. ; Vanier, P. ; Lordi, V. ; Varley, J. ; James, R. B.Journal of applied physics, 2017-03, Vol.121 (12) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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4 |
Material Type: Artigo
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Supersaturating silicon with transition metals by ion implantation and pulsed laser meltingRecht, Daniel ; Smith, Matthew J. ; Charnvanichborikarn, Supakit ; Sullivan, Joseph T. ; Winkler, Mark T. ; Mathews, Jay ; Warrender, Jeffrey M. ; Buonassisi, Tonio ; Williams, James S. ; Gradečak, Silvija ; Aziz, Michael J.Journal of applied physics, 2013-09, Vol.114 (12) [Periódico revisado por pares]United StatesTexto completo disponível |
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5 |
Material Type: Artigo
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Controlling quantum phases of electrons and excitons in moiré superlatticesZhang, Lifu ; Ni, Ruihao ; Zhou, YouJournal of applied physics, 2023-02, Vol.133 (8) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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6 |
Material Type: Artigo
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LuAG:Ce fibers for high energy calorimetryDujardin, C ; Mancini, C ; Amans, D ; Ledoux, G ; Abler, D ; Auffray, E ; Lecoq, P ; Perrodin, D ; Petrosyan, A ; Ovanesyan, K LJournal of applied physics, 2010-07, Vol.108 (1), p.013510-013510-7 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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7 |
Material Type: Artigo
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Single-bunch imaging of detonation fronts using scattered synchrotron radiationNielsen, Michael H. ; Hammons, Joshua A. ; Bagge-Hansen, Michael ; Lauderbach, Lisa M. ; Hodgin, Ralph L. ; Champley, Kyle M. ; Shaw, William L. ; Sinclair, Nicholas ; Klug, Jeffrey A. ; Li, Yuelin ; Schuman, Adam ; van Buuren, Anthony W. ; Watkins, Erik B. ; Gustavsen, Richard L. ; Huber, Rachel C. ; Willey, Trevor M.Journal of applied physics, 2018-06, Vol.123 (22) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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8 |
Material Type: Artigo
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Material-based figure of merit for caloric materialsGriffith, L. D. ; Mudryk, Y. ; Slaughter, J. ; Pecharsky, V. K.Journal of applied physics, 2018-01, Vol.123 (3) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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9 |
Material Type: Artigo
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Surface characterization and functionalization of carbon nanofibersKlein, K L ; Melechko, A V ; McKnight, T E ; Retterer, S T ; Rack, P D ; Fowlkes, J D ; Joy, D C ; Simpson, M LJournal of applied physics, 2008-03, Vol.103 (6), p.061301-061301-26 [Periódico revisado por pares]United States: American Institute of PhysicsTexto completo disponível |
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10 |
Material Type: Artigo
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Tutorial: Defects in semiconductors—Combining experiment and theoryAlkauskas, Audrius ; McCluskey, Matthew D. ; Van de Walle, Chris G.Journal of applied physics, 2016-05, Vol.119 (18) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |