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Material Type: Ata de Congresso
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Numerical study of blood fluid rheology in the abdominal aortaSilva, A M ; Leao, C P ; Teixeira, SFCF ; Teixeira, JCFWIT Transactions on Ecology and the Environment, 2008, Vol.I, p.169-178Southampton: W I T PressTexto completo disponível |
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Material Type: Ata de Congresso
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Axial variation of droplet distribution in a venturi scrubberYates, AWIT Transactions on Ecology and the Environment, 2008, Vol.I, p.179-187Southampton: W I T PressTexto completo disponível |
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Material Type: Ata de Congresso
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An overview of the Clear-PEM breast imaging scannerAlbuquerque, E. ; Almeida, F. G. ; Almeida, P. ; Auffray, E. ; Barbosa, J. ; Bastos, A. L. ; Bexiga, V. ; Bugalho, R. ; Carmona, S. ; Carrico, B. ; Ferreira, C. S. ; Ferreira, N. C. ; Ferreira, M. ; Frade, M. ; Godinho, J. ; Goncalves, F. ; Guerreiro, C. ; Lecoq, P. ; Leong, C. ; Lousa, P. ; Machado, P. ; Martins, M. V. ; Matela, N. ; Moura, R. ; Neves, P. ; Oliveira, N. ; Ortigao, C. ; Piedade, F. ; Pinheiro, J. F. ; Relvas, P. ; Rivetti, A. ; Rodrigues, P. ; Rolo, I. ; Sampaio, J. ; Santos, A. I. ; Santos, J. ; Silva, M. M. ; Tavernier, S. ; Teixeira, I. C. ; Teixeira, J. P. ; Silva, R. ; Silva, J. C. ; Trindade, A. ; Varela, J.2008 IEEE Nuclear Science Symposium Conference Record, 2008, p.5616-5618IEEETexto completo disponível |
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Material Type: Ata de Congresso
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A UMLS interoperable solution to support collaborative diagnosis decision making over the internetPires, D. F. ; Teixeira, C. A. C. ; Ruiz, E. E. S.Proceedings of the 2008 ACM symposium on Applied computing, 2008, p.1400-1404New York, NY, USA: ACMTexto completo disponível |
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Material Type: Ata de Congresso
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Relative Humidity Sensor Based on Rough Polysilicon Thin FilmsZambrozi, P. ; Teixeira, R. C. ; Fruett, F.ECS transactions, 2007, Vol.4 (1), p.107-114Texto completo disponível |
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Material Type: Ata de Congresso
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Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature VariationsSemiao, J. ; Rodriguez-Andina, J.J. ; Vargas, F. ; Santos, M.B. ; Teixeira, I.C. ; Teixeira, J.P.22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007, p.303-311IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Stress Analysis on Ultra Thin Ground WafersTeixeira, R. C. ; De Munck, K. ; De Moor, P. ; Baert, K. ; Swinnen, B. ; Van Hoof, C. ; Kuttel, A.ECS transactions, 2007, Vol.9 (1), p.113-121Texto completo disponível |
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Material Type: Ata de Congresso
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Experimental validation and performance analysis of the clear-PEM data acquisition electronicsBugalho, Ricardo ; Bexiga, Vasco ; Carrico, Bruno ; Ferreira, Claudia S. ; Ferreira, Miguel ; Ferreira, Nuno C. ; Leong, Carlos ; Lousa, Pedro ; Machado, Pedro ; Moura, Rui ; Neves, Pedro ; Ortigao, Catarina ; Piedade, Fernando ; Rego, Joel ; Rodrigues, Pedro ; Teixeira, Isabel C. ; Teixeira, Joao P. ; Silva, Jose C. ; Trindade, Andreia ; Varela, Joao2008 IEEE Nuclear Science Symposium Conference Record, 2008, p.4065-4067IEEETexto completo disponível |
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Material Type: Ata de Congresso
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Influence of Nucleation Parameters in Ge NCs Formation by LPCVDMarins, E S. ; Mestanza, S. N. ; Teixeira, R. C. ; Doi, I.ECS transactions, 2007, Vol.4 (1), p.339-343Texto completo disponível |
10 |
Material Type: Ata de Congresso
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DC Performance and Low Frequency Noise in n-MOSFETs using Self-Aligned Poly-Si/SiGe GateJimenez Grados, Hugo R. ; Manera, Leandro T. ; Cotrin Teixeira, Ricardo ; Rautemberg, Marcia ; Diniz, José A. ; Doi, Ioshiaki ; Tatsch, Peter Jurgen ; Hernandes Figueroa, Hugo Enrique ; Swart, Jacobus W.ECS transactions, 2008, Vol.14 (1), p.137-146Texto completo disponível |