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1
Effect of Radar Incident Angle on Full-Wave Inversion for the Retrieval of Medium Surface Permittivity for Drone-Borne Applications
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Effect of Radar Incident Angle on Full-Wave Inversion for the Retrieval of Medium Surface Permittivity for Drone-Borne Applications

Wu, Kaijun ; Lambot, Sebastien

IEEE transactions on geoscience and remote sensing, 2022, Vol.60, p.1-10 [Periódico revisado por pares]

New York: IEEE

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2
Modeling of Multilayered Media Green's Functions With Rough Interfaces
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Modeling of Multilayered Media Green's Functions With Rough Interfaces

Jonard, Francois ; Andre, Frederic ; Pinel, Nicolas ; Warren, Craig ; Vereecken, Harry ; Lambot, Sebastien

IEEE transactions on geoscience and remote sensing, 2019-10, Vol.57 (10), p.7671-7681 [Periódico revisado por pares]

New York: IEEE

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3
Estimation of Hydraulic Properties of a Sandy Soil Using Ground-Based Active and Passive Microwave Remote Sensing
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Estimation of Hydraulic Properties of a Sandy Soil Using Ground-Based Active and Passive Microwave Remote Sensing

Jonard, Francois ; Weihermuller, Lutz ; Schwank, Mike ; Jadoon, Khan Zaib ; Vereecken, Harry ; Lambot, Sebastien

IEEE transactions on geoscience and remote sensing, 2015-06, Vol.53 (6), p.3095-3109 [Periódico revisado por pares]

New York: IEEE

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4
Accounting for Surface Roughness Scattering in the Characterization of Forest Litter with Ground-Penetrating Radar
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Accounting for Surface Roughness Scattering in the Characterization of Forest Litter with Ground-Penetrating Radar

André, Frédéric ; Jonard, François ; Jonard, Mathieu ; Vereecken, Harry ; Lambot, Sébastien

Remote sensing (Basel, Switzerland), 2019-04, Vol.11 (7), p.828 [Periódico revisado por pares]

Basel: MDPI AG

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5
Mapping Field-Scale Soil Moisture With L-Band Radiometer and Ground-Penetrating Radar Over Bare Soil
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Mapping Field-Scale Soil Moisture With L-Band Radiometer and Ground-Penetrating Radar Over Bare Soil

Jonard, F. ; Weihermuller, L. ; Jadoon, K. Z. ; Schwank, M. ; Vereecken, H. ; Lambot, S.

IEEE transactions on geoscience and remote sensing, 2011-08, Vol.49 (8), p.2863-2875 [Periódico revisado por pares]

New York, NY: IEEE

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6
Accounting for soil surface roughness in the inversion of ultrawideband off-ground GPR signal for soil moisture retrieval
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Accounting for soil surface roughness in the inversion of ultrawideband off-ground GPR signal for soil moisture retrieval

Jonard, François ; Weihermüller, Lutz ; Vereecken, Harry ; Lambot, Sébastien

Geophysics, 2012-01, Vol.77 (1), p.H1-H7 [Periódico revisado por pares]

Tulsa, OK: Society of Exploration Geophysicists

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7
A new drone-borne GPR for soil moisture mapping
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A new drone-borne GPR for soil moisture mapping

Wu, Kaijun ; Rodriguez, Gabriela Arambulo ; Zajc, Marjana ; Jacquemin, Elodie ; Clément, Michiels ; De Coster, Albéric ; Lambot, Sébastien

Remote sensing of environment, 2019-12, Vol.235, p.111456, Article 111456 [Periódico revisado por pares]

New York: Elsevier Inc

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8
Automated Detection of Reflection Hyperbolas in Complex GPR Images With No A Priori Knowledge on the Medium
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Automated Detection of Reflection Hyperbolas in Complex GPR Images With No A Priori Knowledge on the Medium

Mertens, Laurence ; Persico, Raffaele ; Matera, Loredana ; Lambot, Sebastien

IEEE transactions on geoscience and remote sensing, 2016-01, Vol.54 (1), p.580-596 [Periódico revisado por pares]

New York: IEEE

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9
A Comparison of Linear Inverse Scattering Models for Contactless GPR Imaging
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A Comparison of Linear Inverse Scattering Models for Contactless GPR Imaging

Ludeno, Giovanni ; Gennarelli, Gianluca ; Lambot, Sebastien ; Soldovieri, Francesco ; Catapano, Ilaria

IEEE transactions on geoscience and remote sensing, 2020-10, Vol.58 (10), p.7305-7316 [Periódico revisado por pares]

New York: IEEE

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10
Full-Wave Modeling of Near-Field Radar Data for Planar Layered Media Reconstruction
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Full-Wave Modeling of Near-Field Radar Data for Planar Layered Media Reconstruction

Lambot, Sebastien ; Andre, Frederic

IEEE transactions on geoscience and remote sensing, 2014-05, Vol.52 (5), p.2295-2303 [Periódico revisado por pares]

New York, NY: IEEE

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