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1
Gigantic enhancement in response and reset time of ZnO UV nanosensor by utilizing Schottky contact and surface functionalization
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Gigantic enhancement in response and reset time of ZnO UV nanosensor by utilizing Schottky contact and surface functionalization

Zhou, Jun ; Gu, Yudong ; Hu, Youfan ; Mai, Wenjie ; Yeh, Ping-Hung ; Bao, Gang ; Sood, Ashok K. ; Polla, Dennis L. ; Wang, Zhong Lin

Applied physics letters, 2009-05, Vol.94 (19), p.191103-191103-3 [Periódico revisado por pares]

United States: American Institute of Physics

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Analysis of Ce3+ luminescence quenching in solid solutions between Y3Al5O12 and Y3Ga5O12 by temperature dependence of photoconductivity measurement
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Analysis of Ce3+ luminescence quenching in solid solutions between Y3Al5O12 and Y3Ga5O12 by temperature dependence of photoconductivity measurement

Ueda, Jumpei ; Tanabe, Setsuhisa ; Nakanishi, Takayuki

Journal of applied physics, 2011-09, Vol.110 (5), p.053102-053102-6 [Periódico revisado por pares]

American Institute of Physics

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A new fiber-optic non-contact compact laser-ultrasound scanner for fast non-destructive testing and evaluation of aircraft composites
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A new fiber-optic non-contact compact laser-ultrasound scanner for fast non-destructive testing and evaluation of aircraft composites

Pelivanov, Ivan ; Buma, Takashi ; Xia, Jinjun ; Wei, Chen-Wei ; O'Donnell, Matthew

Journal of applied physics, 2014-03, Vol.115 (11), p.113105-113105 [Periódico revisado por pares]

United States: American Institute of Physics

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4
Three-dimensional localization precision of the double-helix point spread function versus astigmatism and biplane
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Three-dimensional localization precision of the double-helix point spread function versus astigmatism and biplane

Badieirostami, Majid ; Lew, Matthew D. ; Thompson, Michael A. ; Moerner, W. E.

Applied physics letters, 2010-10, Vol.97 (16), p.161103-161103-3 [Periódico revisado por pares]

United States: American Institute of Physics

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5
Raman spectroscopy and microscopy based on mechanical force detection
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Raman spectroscopy and microscopy based on mechanical force detection

Rajapaksa, I. ; Kumar Wickramasinghe, H.

Applied physics letters, 2011-10, Vol.99 (16), p.161103-161103-3 [Periódico revisado por pares]

United States: American Institute of Physics

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6
Optofluidic Tomography on a Chip
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Optofluidic Tomography on a Chip

Isikman, Serhan O. ; Bishara, Waheb ; Zhu, Hongying ; Ozcan, Aydogan

Applied physics letters, 2011-04, Vol.98 (16), p.161109-161109-3 [Periódico revisado por pares]

United States: American Institute of Physics

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7
Tuning open-circuit voltage in organic solar cells by magnesium modified Alq3
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Tuning open-circuit voltage in organic solar cells by magnesium modified Alq3

Chou, Chi-Ta ; Lin, Chien-Hung ; Wu, Meng-Hsiu ; Cheng, Tzu-Wei ; Lee, Jiun-Haw ; Liu, Chin-Hsin J. ; Tai, Yian ; Chattopadhyay, Surojit ; Wang, Juen-Kai ; Chen, Kuei-Hsien ; Chen, Li-Chyong

Journal of applied physics, 2011-10, Vol.110 (8), p.083104-083104-5 [Periódico revisado por pares]

American Institute of Physics

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8
Pulsed ultrasound-modulated optical tomography using spectral-hole burning as a narrowband spectral filter
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Pulsed ultrasound-modulated optical tomography using spectral-hole burning as a narrowband spectral filter

Li, Youzhi ; Zhang, Huiliang ; Kim, Chulhong ; Wagner, Kelvin H. ; Hemmer, Philip ; Wang, Lihong V.

Applied physics letters, 2008-07, Vol.93 (1), p.011111-011111-3 [Periódico revisado por pares]

United States: American Institute of Physics

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9
Quantum dot-embedded microspheres for remote refractive index sensing
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Quantum dot-embedded microspheres for remote refractive index sensing

Pang, Shuo ; Beckham, Richard E. ; Meissner, Kenith E.

Applied physics letters, 2008-06, Vol.92 (22), p.221108-221108-3 [Periódico revisado por pares]

United States: American Institute of Physics

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10
Nanopyramid surface plasmon resonance sensors
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Nanopyramid surface plasmon resonance sensors

Chung, Pei-Yu ; Lin, Tzung-Hua ; Schultz, Gregory ; Batich, Christopher ; Jiang, Peng

Applied physics letters, 2010-06, Vol.96 (26), p.261108-261108-3 [Periódico revisado por pares]

United States: American Institute of Physics

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