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Refinado por: data de publicação: 1996Até2010 remover tipo de recurso: Anais de Congresso remover
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Clone detection in automotive model-based development
Clone detection in automotive model-based development
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Clone detection in automotive model-based development

Deissenboeck, Florian ; Hummel, Benjamin ; Jürgens, Elmar ; Schätz, Bernhard ; Wagner, Stefan ; Girard, Jean-François ; Teuchert, Stefan

2008 ACM/IEEE 30th International Conference on Software Engineering, 2008, Vol.2008 (24), p.603-612

New York, NY, USA: ACM

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2
Top-down specialization for information and privacy preservation
Top-down specialization for information and privacy preservation
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Top-down specialization for information and privacy preservation

Fung, B.C.M. ; Wang, K. ; Yu, P.S.

21st International Conference on Data Engineering (ICDE'05), 2005, p.205-216

IEEE

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3
Improvement of productivity by cluster ion implanter: CLARIS
Improvement of productivity by cluster ion implanter: CLARIS
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Improvement of productivity by cluster ion implanter: CLARIS

Tanjyo, Masayasu ; Hamamoto, Nariaki ; Umisedo, Sei ; Koga, Yuji ; Une, Hideyasu ; Maehara, Noriaki ; Kawamura, Yasunori ; Hashino, Yoshikazu ; Nakashima, Yoshiki ; Hashimoto, Masahiro ; Nagayama, Tsutomu ; Onoda, Hiroshi ; Nagai, Nobuo ; Horsky, Tom N. ; Hahto, Sami K. ; Jacobson, Dale C.

2010 International Workshop on Junction Technology Extended Abstracts, 2010, p.1-4

IEEE

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4
Distributed Scrum: Agile Project Management with Outsourced Development Teams
Distributed Scrum: Agile Project Management with Outsourced Development Teams
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Distributed Scrum: Agile Project Management with Outsourced Development Teams

Sutherland, J. ; Viktorov, A. ; Blount, J. ; Puntikov, N.

2007 40th Annual Hawaii International Conference on System Sciences (HICSS'07), 2007, p.274a-274a

IEEE

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5
Evaluating crop land productivity using MODIS derived time serious field greenness and water index in North China Plain
Evaluating crop land productivity using MODIS derived time serious field greenness and water index in North China Plain
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Evaluating crop land productivity using MODIS derived time serious field greenness and water index in North China Plain

Wang, Zhen ; Shu, Yunqiao ; Zhang, Shengwei ; Li, Hongjun ; Lei, Yuping

SPIE 2009

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6
EUV into production with ASML's NXE platform
EUV into production with ASML's NXE platform
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EUV into production with ASML's NXE platform

WAGNER, Christian ; HARNED, Noreen ; THUERING, Bernd ; KUERZ, Peter ; LOWISCH, Martin ; MEILING, Hans ; OCKWELL, David ; PEETERS, Rudy ; VAN INGEN-SCHENAU, Koen ; VAN SETTEN, Eelco ; STOELDRAIJER, Judon

Proceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7636

Bellingham: SPIE

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7
Collaboration Engineering: Designing Repeatable Processes for High-Value Collaborative Tasks
Collaboration Engineering: Designing Repeatable Processes for High-Value Collaborative Tasks
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Collaboration Engineering: Designing Repeatable Processes for High-Value Collaborative Tasks

de Vreede, G.-J. ; Briggs, R.O.

Proceedings of the 38th Annual Hawaii International Conference on System Sciences, 2005, p.17c-17c

IEEE

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8
Clones: What is that smell?
Clones: What is that smell?
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Clones: What is that smell?

Rahman, Foyzur ; Bird, Christian ; Devanbu, Premkumar

2010 7th IEEE Working Conference on Mining Software Repositories (MSR 2010), 2010, p.72-81

IEEE

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9
A co-design approach for embedded system modeling and code generation with UML and MARTE
A co-design approach for embedded system modeling and code generation with UML and MARTE
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A co-design approach for embedded system modeling and code generation with UML and MARTE

Vidal, J. ; de Lamotte, F. ; Gogniat, G. ; Soulard, P. ; Diguet, J.-P.

2009 Design, Automation & Test in Europe Conference & Exhibition, 2009, p.226-231

IEEE

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10
The secret life of bugs: Going past the errors and omissions in software repositories
The secret life of bugs: Going past the errors and omissions in software repositories
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The secret life of bugs: Going past the errors and omissions in software repositories

Aranda, Jorge ; Venolia, Gina

2009 IEEE 31st International Conference on Software Engineering, 2009, p.298-308

Washington, DC, USA: IEEE Computer Society

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