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High resolution microanalysis in materials science using electron energy loss measurements
High resolution microanalysis in materials science using electron energy loss measurements
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High resolution microanalysis in materials science using electron energy loss measurements

Williams, D. B. ; Edington, J. W.

Journal of microscopy (Oxford), 1976-11, Vol.108 (2), p.113-145 [Periódico revisado por pares]

Oxford, UK: Blackwell Publishing Ltd

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2
Frequency response of atomic force microscope cantilevers immersed in fluids and applications / James Won Min Chon
Frequency response of atomic force microscope cantilevers immersed in fluids and applications / James Won Min Chon
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Frequency response of atomic force microscope cantilevers immersed in fluids and applications / James Won Min Chon

Chon, James Won Min

1900

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3
Comparative study of lithium fluoride and graphite by atomic force microscopy (AFM)
Comparative study of lithium fluoride and graphite by atomic force microscopy (AFM)
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Comparative study of lithium fluoride and graphite by atomic force microscopy (AFM)

Meyer, E. ; Heinzelmann, H. ; Grütter, P. ; Jung, Th ; Weisskopf, Th ; Hidber, H.-R. ; Lapka, R. ; Rudin, H. ; Güntherodt, H.-J.

The Monthly Microscopical Journal, 1870-02, Vol.3 (2), p.269-280 [Periódico revisado por pares]

Oxford, UK: Blackwell Publishing Ltd

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4
Computer simulation of weak‐beam images of extended dislocations in copper
Computer simulation of weak‐beam images of extended dislocations in copper
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Computer simulation of weak‐beam images of extended dislocations in copper

Perrin, R. C. ; Savino, E. J.

Journal of microscopy (Oxford), 1973-07, Vol.98 (2), p.214-220 [Periódico revisado por pares]

Oxford, UK: Blackwell Publishing Ltd

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5
Colloidal forces measured between two solid surfaces and between a solid surface and an air bubble
Colloidal forces measured between two solid surfaces and between a solid surface and an air bubble
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Colloidal forces measured between two solid surfaces and between a solid surface and an air bubble

Fielden, Matthew L

1900

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6
The agglomeration of fine iron particles in a fluidised bed cascade / by Daniel Laurence Blundell
The agglomeration of fine iron particles in a fluidised bed cascade / by Daniel Laurence Blundell
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The agglomeration of fine iron particles in a fluidised bed cascade / by Daniel Laurence Blundell

Blundell, Daniel Laurence

1969

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7
STM and AFM investigations of high-Tc superconductors
STM and AFM investigations of high-Tc superconductors
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STM and AFM investigations of high-Tc superconductors

Heinzelmann, H. ; Anselmetti, D. ; Wiesendanger, R. ; Hidber, H.-R. ; Güntherodt, H.-J. ; Düggelin, M. ; Guggenheim, R. ; Schmidt, H. ; Güntherodt, G.

The Monthly Microscopical Journal, 1870-03, Vol.3 (3), p.399-405 [Periódico revisado por pares]

Oxford, UK: Blackwell Publishing Ltd

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8
The Scanning Data Collection Strategy for Enhancing the Quality of Electrical Impedance Tomography
The Scanning Data Collection Strategy for Enhancing the Quality of Electrical Impedance Tomography
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The Scanning Data Collection Strategy for Enhancing the Quality of Electrical Impedance Tomography

Huang, Cheng-Ning ; Yu, Fang-Ming ; Chung, Hung-Yuan

IEEE transactions on instrumentation and measurement, 1900, p.1-1 [Periódico revisado por pares]

IEEE

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9
Microrheology of human lung epithelial cells measured by atomic force microscopy
Microrheology of human lung epithelial cells measured by atomic force microscopy
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Microrheology of human lung epithelial cells measured by atomic force microscopy

Alcaraz Casademunt, Jordi ; Buscemi Estefanell, Lara ; Grabulosa Descals, Mireia ; Trepat Guixer, Xavier ; Fabry, Ben ; Farré Ventura, Ramon ; Navajas Navarro, Daniel

Biophysical Society 1900-12

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10
Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection
Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection
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Combined Apertureless Near-Field Optical Second-Harmonic Generation/Atomic Force Microscopy Imaging and Nanoscale Limit of Detection

Meyer, Kent A ; Ng, Kin C ; Gu, Zhanjun ; Pan, Zhengwei ; Whitten, William B ; Shaw, Robert W

Applied spectroscopy, 1901-01 (64), p.1-7 [Periódico revisado por pares]

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