Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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11 |
Material Type: Artigo
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Enhancing the precision of 3D sidewall measurements of photoresist using atomic force microscopy with a tip-tilting techniqueKizu, Ryosuke ; Misumi, Ichiko ; Hirai, Akiko ; Gonda, SatoshiJournal of applied physics, 2023-02, Vol.133 (6) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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12 |
Material Type: Artigo
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Advances in dynamic AFM: From nanoscale energy dissipation to material properties in the nanoscaleSantos, Sergio ; Gadelrab, Karim ; Lai, Chia-Yun ; Olukan, Tuza ; Font, Josep ; Barcons, Victor ; Verdaguer, Albert ; Chiesa, MatteoJournal of applied physics, 2021-04, Vol.129 (13) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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13 |
Material Type: Artigo
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Molecular beam epitaxy of antiferromagnetic (MnBi2Te4)(Bi2Te3) thin films on BaF2 (111)Kagerer, P. ; Fornari, C. I. ; Buchberger, S. ; Morelhão, S. L. ; Vidal, R. C. ; Tcakaev, A. ; Zabolotnyy, V. ; Weschke, E. ; Hinkov, V. ; Kamp, M. ; Büchner, B. ; Isaeva, A. ; Bentmann, H. ; Reinert, F.Journal of applied physics, 2020-10, Vol.128 (13) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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14 |
Material Type: Artigo
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Acoustic subsurface-atomic force microscopy: Three-dimensional imaging at thenanoscaleSharahi, Hossein J ; Janmaleki Mohsen ; Tetard Laurene ; Kim, Seonghwan ; Verbiest, Gerard JJournal of applied physics, 2021-01, Vol.129 (3) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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15 |
Material Type: Artigo
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Low-loss superconducting titanium nitride grown using plasma-assisted molecular beam epitaxyRichardson, C. J. K. ; Alexander, A. ; Weddle, C. G. ; Arey, B. ; Olszta, M.Journal of applied physics, 2020-06, Vol.127 (23) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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16 |
Material Type: Artigo
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Carrier localization in the vicinity of dislocations in InGaNMassabuau, F. C-P. ; Chen, P. ; Horton, M. K. ; Rhode, S. L. ; Ren, C. X. ; O'Hanlon, T. J. ; Kovács, A. ; Kappers, M. J. ; Humphreys, C. J. ; Dunin-Borkowski, R. E. ; Oliver, R. A.Journal of applied physics, 2017-01, Vol.121 (1) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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17 |
Material Type: Artigo
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Van der Waals heterostructures based on 2D layered materials: Fabrication, characterization, and application in photodetectionYao, Jiandong ; Yang, GuoweiJournal of applied physics, 2022-04, Vol.131 (16) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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18 |
Material Type: Artigo
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Simultaneous scanning ion conductance and atomic force microscopy with ananopore: Effect of the aperture edge on the ion current imagesDorwling-Carter Livie ; Aramesh Morteza ; ró Csaba ; Tiefenauer, Raphael F ; Shorubalko Ivan ; Vörös János ; Zambelli TomasoJournal of applied physics, 2018-11, Vol.124 (17) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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19 |
Material Type: Artigo
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Growth of HfO2/TiO2 nanolaminates by atomic layer deposition and HfO2-TiO2 by atomic partial layer depositionHernández-Arriaga, H. ; López-Luna, E. ; Martínez‐Guerra, E. ; Turrubiartes, M. M. ; Rodríguez, A. G. ; Vidal, M. A.Journal of applied physics, 2017-02, Vol.121 (6) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |
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20 |
Material Type: Artigo
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Experimental use of the inflection point test for force deconvolution in frequency-modulation atomic force microscopy to turn an ill-posed situation into a well-posed one by proper choice of amplitudeHuber, Ferdinand ; Giessibl, Franz J.Journal of applied physics, 2020-05, Vol.127 (18) [Periódico revisado por pares]Melville: American Institute of PhysicsTexto completo disponível |