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Electronic structure and properties of isoelectronic magic clusters: Al13X (X=H,Au,Li,Na,K,Rb,Cs)Ko, Yeon Jae ; Shakya, Anisha ; Wang, Haopeng ; Grubisic, Andrej ; Zheng, Weijun ; Gotz, Matthias ; Gantefor, Gerd ; Bowen, Kit H ; Jena, Puru ; Kiran, BoggavarapuVCU Scholars Compass 2010Texto completo disponível |
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Material Type: Recurso Textual
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Regulation of high mobility group box 1 and hypoxia in the migration of mesenchymal stem cellsHong-Lei Xie; Yi Zhang; Yi-Zhou Huang; Shun Li; Cheng-Guang Wu; Mei-Yun Tan; Yong-Can Huang; Xiao-He Chen; Li DengCell Biology International v. 38, n. 7, p. 892-897, Jul. 2014London John Wiley & Sons Chichester 2014Localização: FOB - Fac. Odontologia de Bauru (S1026 )(Acessar) |
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Material Type: Recurso Textual
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Effect of dietary protein and energy intake on embryonic survival and gene expression in the uterine endometrium of early pregnant gilts (vol 16, 100540, 2022)Zhao, XM ; Jiang, XR ; Xia, T ; Sureda, E Arevalo ; Schroyen, M ; Everaert, N ; Li, XLANIMAL, 2023, Vol.17 (1)ELSEVIERTexto completo disponível |
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Material Type: Recurso Textual
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The effect of stair case electron injector design on electron overflow in InGaN light emitting diodesZhang, F ; Li, X ; Hafiz, S ; Okur, S ; Avrutin, Vitaliy ; Ozgur, U ; Morkoç, Hadis ; Matulionis, AVCU Scholars Compass 2013Texto completo disponível |
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Material Type: Recurso Textual
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Determination of the thermal parameters of a clay from heating cell testsRomero Morales, Enrique Edgar ; Lima Amorim, Analice França ; Gens Solé, Antonio ; Vaunat, Jean ; Li, X. L2013Texto completo disponível |
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Material Type: Recurso Textual
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Behavioural measurement software tool with hardware componentLi, X ; Shan, K ; Zaman, Bieke ; Van Overveldt, MLeuven: Thesis paper Master of Industrial Sciences, GroupT 2009Texto completo disponível |
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Material Type: Recurso Textual
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Analysis of the excavation of a deep drift in a tertiary clayVaunat, Jean ; Gens Solé, Antonio ; de Vasconcelos, R ; Li, X.-LInternational Centre for Computational Engineering 2011Texto completo disponível |
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Material Type: Recurso Textual
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Degradation in InAlN/AlN/GaN heterostructure field-effect transistors as monitored by low-frequency noise measurements: Hot phonon effectsKayis, C ; Ferreyra, Romualdo A ; Wu, M ; Li, X ; Özgür, Ü ; Matulionis, A ; Morkoç, HadisVCU Scholars Compass 2011Texto completo disponível |
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9 |
Material Type: Recurso Textual
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Field-assisted emission in AlGaN/GaN heterostructure field-effect transistors using low-frequency noise techniqueKayis, Cemil ; Zhu, C. Y ; Wu, Mo ; Li, X ; Özgür, Ümit ; Morkoç, HadisVCU Scholars Compass 2011Texto completo disponível |
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10 |
Material Type: Recurso Textual
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Hot electron effects on efficiency degradation in InGaN light emitting diodes and designs to mitigate themNi, X ; Li, X ; Lee, J ; Liu, S ; Avrutin, V ; Özgür, Ü ; Morkoç, H ; Matulionis, AVCU Scholars Compass 2010Texto completo disponível |