Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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Material Type: Artigo
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Which Components Are Important For Interactive Image Searching?Tao, Dacheng ; Tang, Xiaoou ; Li, XuelongIEEE transactions on circuits and systems for video technology, 1900, p.1-1 [Periódico revisado por pares]IEEESem texto completo |
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2 |
Material Type: Artigo
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WAVELET DECOMPOSITION OF PSEUDO-MOTION IMAGE AND APPLICATION TO PREQUENCY SEGMENTATIONTang, Yuan Yan ; Cui, Limin ; Jin, NingInternational journal of pattern recognition and artificial intelligence, 1901-01, Vol.25 (7), p.1089-1112 [Periódico revisado por pares]Sem texto completo |
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3 |
Material Type: Artigo
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Rapid Acquisition of Radar Targets from Moving and Static DisplaysSimon, Charles W.Human factors, 1965-06, Vol.7 (3), p.185-205 [Periódico revisado por pares]Los Angeles, CA: SAGE PublicationsSem texto completo |
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4 |
Material Type: Artigo
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Automatic photointerpretation and target locationHolmes, W.S.Proceedings of the IEEE, 1966-01, Vol.54 (12), p.1679-1686 [Periódico revisado por pares]IEEETexto completo disponível |
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5 |
Material Type: Artigo
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Pattern Recognition, Functionals, and EntropyBremermann, Hans J.IEEE transactions on biomedical engineering, 1968-07, Vol.BME-15 (3), p.201-207 [Periódico revisado por pares]United States: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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A Visual Image ProcessorRussell, J.K.IEEE transactions on computers, 1968-07, Vol.C-17 (7), p.635-639 [Periódico revisado por pares]IEEETexto completo disponível |
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7 |
Material Type: Artigo
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Feature extraction: A surveyLevine, M.D.Proceedings of the IEEE, 1969-01, Vol.57 (8), p.1391-1407 [Periódico revisado por pares]IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Pattern recognition with measurement space and spatial clustering for multiple imagesHaralick, R.M. ; Kelly, G.L.Proceedings of the IEEE, 1969-01, Vol.57 (4), p.654-665 [Periódico revisado por pares]IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Thresholded Convolutions OperationsSklansky, JJournal of the ACM, 1970-01, Vol.17 (1), p.161-165 [Periódico revisado por pares]ACMTexto completo disponível |
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10 |
Material Type: Artigo
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Diffraction-pattern sampling for automatic pattern recognitionLendaris, G.G. ; Stanley, G.L.Proceedings of the IEEE, 1970-01, Vol.58 (2), p.198-216 [Periódico revisado por pares]IEEETexto completo disponível |