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Millimeter-Wave FET Nonlinear Modelling Based on the Dynamic-Bias Measurement Technique
Millimeter-Wave FET Nonlinear Modelling Based on the Dynamic-Bias Measurement Technique
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Millimeter-Wave FET Nonlinear Modelling Based on the Dynamic-Bias Measurement Technique

Avolio, Gustavo ; Raffo, Antonio ; Angelov, Iltcho ; Vadala, Valeria ; Crupi, Giovanni ; Caddemi, Alina ; Vannini, Giorgio ; Schreurs, Dominique M. M.-P

IEEE transactions on microwave theory and techniques, 2014-11, Vol.62 (11), p.2526-2537 [Periódico revisado por pares]

New York: IEEE

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2
A novel technique for the extraction of nonlinear model for microwave transistors under dynamic-bias operation
A novel technique for the extraction of nonlinear model for microwave transistors under dynamic-bias operation
Material Type:
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A novel technique for the extraction of nonlinear model for microwave transistors under dynamic-bias operation

Avolio, G. ; Raffo, A. ; Angelov, I. ; Crupi, G. ; Vannini, G. ; Schreurs, D.

2013 IEEE MTT-S International Microwave Symposium Digest (MTT), 2013, p.1-3

IEEE

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3
Waveforms-Only Based Nonlinear De-Embedding in Active Devices
Waveforms-Only Based Nonlinear De-Embedding in Active Devices
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Waveforms-Only Based Nonlinear De-Embedding in Active Devices

Avolio, G. ; Schreurs, D. M. M-P ; Raffo, A. ; Crupi, G. ; Vannini, G. ; Nauwelaers, B.

IEEE microwave and wireless components letters, 2012-04, Vol.22 (4), p.215-217

New York, NY: IEEE

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4
Small-Versus Large-Signal Extraction of Charge Models of Microwave FETs
Small-Versus Large-Signal Extraction of Charge Models of Microwave FETs
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Small-Versus Large-Signal Extraction of Charge Models of Microwave FETs

Avolio, Gustavo ; Raffo, Antonio ; Angelov, Iltcho ; Crupi, Giovanni ; Caddemi, Alina ; Vannini, Giorgio ; Schreurs, Dominique M. M.-P

IEEE microwave and wireless components letters, 2014-06, Vol.24 (6), p.394-396

New York, NY: IEEE

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5
Hybrid measurement-based extraction of consistent large-signal models for microwave FETs
Hybrid measurement-based extraction of consistent large-signal models for microwave FETs
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Hybrid measurement-based extraction of consistent large-signal models for microwave FETs

Angelov, I. ; Thorsell, M. ; Kuylenstierna, D. ; Avolio, G. ; Schreurs, D. ; Raffo, A. ; Vannini, G.

2013 European Microwave Conference, 2013, p.267-270

European Microwave Association

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6
Influence of the gate current dynamic behaviour on GaAs HEMT reliability issues
Influence of the gate current dynamic behaviour on GaAs HEMT reliability issues
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Influence of the gate current dynamic behaviour on GaAs HEMT reliability issues

Vadala, V. ; Bosi, G. ; Raffo, A. ; Vannini, G. ; Avolio, G. ; Schreurs, D. M. P.

2012 7th European Microwave Integrated Circuit Conference, 2012, p.258-261

IEEE

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7
On-Wafer LSNA measurements including dynamic-bias
On-Wafer LSNA measurements including dynamic-bias
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On-Wafer LSNA measurements including dynamic-bias

Avolio, G. ; Pailloncy, G. ; Schreurs, D. ; Bossche, M. Vanden ; Nauwelaers, B.

2009 European Microwave Conference (EuMC), 2009, p.930-933

IEEE

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8
Linear versus nonlinear de-embedding: Experimental investigation
Linear versus nonlinear de-embedding: Experimental investigation
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Linear versus nonlinear de-embedding: Experimental investigation

Raffo, A. ; Vadala, V. ; Avolio, G. ; Bosi, G. ; Nalli, A. ; Schreurs, D. M. M.-P ; Vannini, G.

81st ARFTG Microwave Measurement Conference, 2013, p.1-5

IEEE

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