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Refinado por: Base de dados/Biblioteca: Wiley-Blackwell Full Collection 2013 remover idioma: Francês remover nível superior: Revistas revisadas por pares remover
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RAPD and SCAR markers linked to a gene conferring resistance to angular leaf spot in common bean
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RAPD and SCAR markers linked to a gene conferring resistance to angular leaf spot in common bean

Nietsche, S ; Borem, A ; Carvalho, G.A ; Rocha, R.C ; Paula, T.J. Jr ; Barros, E.G. de ; Moreira, M.A

Journal of phytopathology, 2000-02, Vol.148 (2), p.117-121 [Periódico revisado por pares]

Oxford, UK: Blackwell Science, Ltd

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