Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Fast software encryption: 11th international workshop, FSE 2004, Delhi, India, February 5-7, 2004 : revised papersRoy, Bimal Kumar ; Meier, WilliSpringer 1900Texto completo disponível |
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2 |
Material Type: Livro
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Applied cryptography and network security: 11th International Conference, ACNS 2013, Banff, AB, Canada, June 25-28, 2013, proceedingsJakobsson, Markus ; Yung, Moti ; Zhou, JianyingSpringer 1900Texto completo disponível |
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3 |
Material Type: Livro
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Public Key Cryptography -- PKC 2004: 7th International Workshop on Theory and Practice in Public Key Cryptography, Singapore, March 1-4, 2004Bao, Feng ; Deng, Robert ; Zhou, JianyingSpringer 1900Texto completo disponível |
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4 |
Material Type: Livro
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Mechanische TechnologieKopecky, A ; Schamschula, RVienna: Springer Vienna 1961Sem texto completo |
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5 |
Material Type: Livro
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Financial cryptography: 8th International Conference, FC 2004, Key West, Fl, USA February 9-12 2004 ; revised papersJuels, AriSpringer 1900Texto completo disponível |
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6 |
Material Type: Livro
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Verschleierung der Angaben von Elektrizitätszählern und AbhilfeGeldermann, ArthurBerlin, Heidelberg: Springer Berlin Heidelberg 1923Sem texto completo |
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7 |
Material Type: Livro
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Mathematical recreations and essaysBall, W. W. Rouse 1850-1925England: Macmillan, 1914 1914Texto completo disponível |
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8 |
Material Type: Artigo
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PROTECTING DATA BY ENCRYPTIONSykes, David JDatamation, 1976-08, Vol.22 (8), p.81Barrington: Reed Business Information, a division of Reed Elsevier, IncSem texto completo |
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9 |
Material Type: Artigo
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Special Feature Exhaustive Cryptanalysis of the NBS Data Encryption StandardDiffie, W. ; Hellman, M.E.Computer (Long Beach, Calif.), 1977-06, Vol.10 (6), p.74-84 [Periódico revisado por pares]IEEETexto completo disponível |
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10 |
Material Type: Artigo
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A New Nonlinear Pseudorandom Number GeneratorGait, J.IEEE transactions on software engineering, 1977-09, Vol.SE-3 (5), p.359-363 [Periódico revisado por pares]New York: IEEETexto completo disponível |