Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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Development of hybrid four-point bending test for determining mechanical properties of thin films using finite element method and response surface methodKINOSHITA, KProceedings of SPIE, the International Society for Optical Engineering, 2010, Vol.7522Bellingham, Wash: SPIETexto completo disponível |
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2 |
Material Type: Ata de Congresso
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On low-capture-power test generation for scan testingXiaoqing Wen ; Yamashita, Y. ; Kajihara, S. ; Laung-Terng Wang ; Saluja, K.K. ; Kinoshita, K.23rd IEEE VLSI Test Symposium (VTS'05), 2005, p.265-270IEEETexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Nonvolatile logic-in-memory array processor in 90nm MTJ/MOS achieving 75% leakage reduction using cycle-based power gatingNatsui, M. ; Suzuki, D. ; Sakimura, N. ; Nebashi, R. ; Tsuji, Y. ; Morioka, A. ; Sugibayashi, T. ; Miura, S. ; Honjo, H. ; Kinoshita, K. ; Ikeda, S. ; Endoh, T. ; Ohno, H. ; Hanyu, T.2013 IEEE International Solid-State Circuits Conference Digest of Technical Papers, 2013, p.194-195IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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High-speed and reliable domain wall motion device: Material design for embedded memory and logic applicationFukami, S. ; Yamanouchi, M. ; Koyama, T. ; Ueda, K. ; Yoshimura, Y. ; Kim, K.-J ; Chiba, D. ; Honjo, H. ; Sakimura, N. ; Nebashi, R. ; Kato, Y. ; Tsuji, Y. ; Morioka, A. ; Kinoshita, K. ; Miura, S. ; Suzuki, T. ; Tanigawa, H. ; Ikeda, S. ; Sugibayashi, T. ; Kasai, N. ; Ono, T. ; Ohno, H.2012 Symposium on VLSI Technology (VLSIT), 2012, p.61-62IEEETexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Organ dysfunction assessment score for severe head injury patients during brain hypothermiaUtagawa, A. ; Sakurai, A. ; Kinoshita, K. ; Moriya, T. ; Okuno, K. ; Tanjoh, K.Brain Edema XIII, p.33-36 [Periódico revisado por pares]Vienna: Springer ViennaTexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Low Power and High Speed Switching of Ti-doped NiO ReRAM under the Unipolar Voltage Source of less than 3 VTsunoda, K. ; Kinoshita, K. ; Noshiro, H. ; Yamazaki, Y. ; Iizuka, T. ; Ito, Y. ; Takahashi, A. ; Okano, A. ; Sato, Y. ; Fukano, T. ; Aoki, M. ; Sugiyama, Y.2007 IEEE International Electron Devices Meeting, 2007, p.767-770IEEETexto completo disponível |
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7 |
Material Type: Ata de Congresso
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Camera model selection based on geometric AICKinoshita, K. ; Lindenbaum, L.Proceedings IEEE Conference on Computer Vision and Pattern Recognition. CVPR 2000 (Cat. No.PR00662), 2000, Vol.2, p.514-519 vol.2IEEETexto completo disponível |
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8 |
Material Type: Ata de Congresso
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Growth of large platy InGaAs crystals and fabrication of semiconductor laser diodesKinoshita, K ; Yoda, S ; Arai, M ; Kawaguchi, Y ; Kondo, Y ; Kano, F ; Aoki, H ; Hosokawa, T ; Yamamoto, S2010 22nd International Conference on Indium Phosphide and Related Materials (IPRM), 2010, p.1-3IEEETexto completo disponível |
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9 |
Material Type: Ata de Congresso
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Outrigger telescopes for narrow-angle astrometryBell, James ; Walker, James M ; Wizinowich, Peter L ; Tsubota, Kevin ; Rudeen, Andy C ; McBride, Dennis ; Kinoshita, Kyle K ; Hrynevych, Michael ; Goude, Patricia ; Colavita, M. Mark ; Kelley, James H ; van Belle, Gerard T ; Brunswick, Robert ; Little, John K ; Smith, Craig HProceedings of SPIE, 2004, Vol.5489, p.962-973SPIETexto completo disponível |
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10 |
Material Type: Ata de Congresso
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A multilevel hierarchical distributed IP mobility management scheme for wide area networksKawano, K. ; Kinoshita, K. ; Murakami, K.Proceedings. Eleventh International Conference on Computer Communications and Networks, 2002, p.480-484IEEETexto completo disponível |