Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Livro
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Tradeoffs and Optimization in Analog CMOS DesignBinkley, DavidNewark: Wiley-Interscience 2008Texto completo disponível |
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2 |
Material Type: Ata de Congresso
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Static Stack-Preserving Intra-Procedural Slicing of WebAssembly BinariesStievenart, Quentin ; Binkley, David W. ; De Roover, Coen2022 IEEE/ACM 44th International Conference on Software Engineering (ICSE), 2022, p.2031-2042ACMSem texto completo |
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3 |
Material Type: Artigo
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An empirical study of identifier splitting techniquesHill, Emily ; Binkley, David ; Lawrie, Dawn ; Pollock, Lori ; Vijay-Shanker, K.Empirical software engineering : an international journal, 2014-12, Vol.19 (6), p.1754-1780 [Periódico revisado por pares]Boston: Springer USTexto completo disponível |
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4 |
Material Type: Artigo
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An Exploratory Study of the Relationship Between Software Test Smells and Fault-PronenessQusef, Abdallah ; Elish, Mahmoud O. ; Binkley, DavidIEEE access, 2019, Vol.7, p.139526-139536 [Periódico revisado por pares]Piscataway: IEEETexto completo disponível |
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5 |
Material Type: Artigo
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FlagRemover: A testability transformation for transforming loop-assigned flagsBinkley, David ; Harman, Mark ; Lakhotia, KiranACM transactions on software engineering and methodology, 2011-08, Vol.20 (3), p.1-33 [Periódico revisado por pares]ACMTexto completo disponível |
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6 |
Material Type: Artigo
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An empirical study of slice-based cohesion and coupling metricsMeyers, Timothy ; Binkley, DavidACM transactions on software engineering and methodology, 2007-12, Vol.17 (1), p.1-27 [Periódico revisado por pares]ACMTexto completo disponível |
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7 |
Material Type: Artigo
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An empirical study of static program slice sizeBinkley, David ; Gold, Nicolas ; Harman, MarkACM transactions on software engineering and methodology, 2007-04, Vol.16 (2), p.8-es [Periódico revisado por pares]ACMTexto completo disponível |
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8 |
Material Type: Artigo
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Concept Learning versus Problem Solving: Evaluating a Threat to the Validity of a Particulate Gas Law QuestionSanger, Michael J ; Vaughn, C. Kevin ; Binkley, David AJournal of chemical education, 2013-06, Vol.90 (6), p.700-709 [Periódico revisado por pares]Easton: American Chemical Society and Division of Chemical Education, IncTexto completo disponível |
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9 |
Material Type: Artigo
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A 100-ps time-resolution CMOS time-to-digital converter for positron emission tomography imaging applicationsSwann, B.K. ; Blalock, B.J. ; Clonts, L.G. ; Binkley, D.M. ; Rochelle, J.M. ; Breeding, E. ; Baldwin, K.M.IEEE journal of solid-state circuits, 2004-11, Vol.39 (11), p.1839-1852 [Periódico revisado por pares]New York, NY: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Evaluating test-to-code traceability recovery methods through controlled experimentsQusef, Abdallah ; Bavota, Gabriele ; Oliveto, Rocco ; Lucia, Andrea De ; Binkley, DavidJournal of software : evolution and process, 2013-11, Vol.25 (11), p.1167-1191 [Periódico revisado por pares]Chichester: Blackwell Publishing LtdTexto completo disponível |