Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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High performance resist for EUV lithographyGonsalves, K.E. ; Thiyagarajan, M. ; Choi, J.H. ; Zimmerman, Paul ; Cerrina, F. ; Nealey, P. ; Golovkina, V. ; Wallace, J. ; Batina, NikolaMicroelectronic engineering, 2005, Vol.77 (1), p.27-35 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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2 |
Material Type: Artigo
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Micro/nano machining of polymeric substrates by ion beam techniquesHe, W ; Poker, D.B ; Gonsalves, K.E ; Batina, NMicroelectronic Engineering, 2003-01, Vol.65 (1), p.153-161 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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3 |
Material Type: Artigo
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Nanocomposite resist systems for next generation lithographyMerhari, L ; Gonsalves, K.E ; Hu, Y ; He, W ; Huang, W.-S ; Angelopoulos, M ; Bruenger, W.H ; Dzionk, C ; Torkler, MMicroelectronic engineering, 2002-09, Vol.63 (4), p.391-403 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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4 |
Material Type: Artigo
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High sensitivity nanocomposite resists for EUV lithographyAzam Ali, M ; Gonsalves, K.E ; Golovkina, V ; Cerrina, FMicroelectronic engineering, 2003-05, Vol.65 (4), p.454-462 [Periódico revisado por pares]Amsterdam: Elsevier B.VTexto completo disponível |
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5 |
Material Type: Capítulo de Livro
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Chapter 1 - Chemical synthesis of nanostructured metals, metal alloys, and semiconductorsGonsalves, K.E. ; Rangarajan, S.P. ; Wang, J.Nanostructured Materials and Nanotechnology, 2002, p.1-56Elsevier IncTexto completo disponível |
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6 |
Material Type: Artigo
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Nanocomposite resist systems for next-generation lithographyMerhari, L ; Gonsalves, K.E ; Hu, Y ; He, W ; Huang, W.S ; Angelopoulos, M ; Bruenger, W.H ; Dzionk, C ; Torkler, M2002Sem texto completo |
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7 |
Material Type: Ata de Congresso
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Undulator-Based Laser Wakefield Accelerator Electron Beam Energy Spread and Emittance DiagnosticBakeman, M.S. ; Van Tilborg, J. ; Nakamura, K. ; Gonsalves, A. ; Osterhoff, J. ; Sokollik, T. ; Lin, C. ; Robinson, K.E. ; Schroeder, C.B. ; Toth, Cs ; Weingartner, R. ; Gruner, F. ; Esarey, E. ; Leemans, W.P.United States 2010Sem texto completo |