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Technical Study on Improvement of Endurance Capability of Limit Short-circuit Current of Charge Control SMART MeterLi, W W ; Du, Z Z ; Yuan, R m ; Xiong, D Z ; Shi, E W ; Lu, G N ; Dai, Z Y ; Chen, X Q ; Jiang, Z Y ; Lv, Y GIOP conference series. Earth and environmental science, 2017-10, Vol.86 (1), p.12025 [Periódico revisado por pares]Bristol: IOP PublishingTexto completo disponível |