11
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Leakage Current Behavior in HfO 2 /SiO 2 /Al 2 O 3 Stacked Dielectric on 4H-SiC Substrate
Huang, Hao ; Wang, Ying ; Chen, Ke-Han ; Fei, Xin-Xing
Electron Devices Society, IEEE Journal of the, 2023, Vol.11, p.438-443
IEEE
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12
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Impact of Inherent Design Limitations for Cu-Sn SLID Microbumps on Its Electromigration Reliability for 3D ICs
Tiwary, Nikhilendu ; Ross, Glenn ; Vuorinen, Vesa ; Paulasto-Krockel, Mervi
Electron Devices, IEEE Transactions on, 2023, Vol.70, p.222-229
IEEE
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13
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Reconfigurable Plasma Composite Absorber Coupled With Pixelated Frequency Selective Surface Generated by FD-CGAN
Yu, Mengjie ; Wang, Haitao ; Gao, Xiangxiang ; Ren, Xi ; Tian, Zunyi ; Ding, Henggao ; Hou, Zhongyu
Access, IEEE, 2023, Vol.11, p.3914-3925
IEEE
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14
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Experimental Demonstration of the Impact of the Parameters of Floating Guard Ring on Planar InP/InGaAs-Based Avalanche Photodiodes' Performance and Its Optimization
Zhang, Junyang ; Li, Xuanzhang ; Du, Chunhua ; Jiang, Yang ; Ma, Ziguang ; Chen, Hong ; Jia, Haiqiang ; Wang, Wenxin ; Deng, Zhen
Photonics Journal, IEEE, 2022, Vol.14, p.1-6
IEEE
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15
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Research on Arc Length Tracking Control Technology of Tube-Sheet Welding Based on Pulsed TIG
Ma, Jianhua ; Wang, Xingdong ; Kong, Jianyi ; Rong, Youmin ; Huang, Yu
Access, IEEE, 2023, Vol.11, p.79087-79095
IEEE
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16
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Application of e-Beam Voltage Contrast Technique for Overlay Improvement and Process Window Control in Multi-Patterning Interconnect Scheme
Yang, Linrong ; Li, Runling ; Hsu, Ikai ; Zhang, Haiqiong ; Ren, Jiadong ; Zhou, Wenzhan ; Sun, Linlin ; Xue, Yawen ; Yang, Wenchao ; Zhang, Ruilin ; Zhu, Yefang ; Zhang, Yan ; Zhang, Guifeng ; Fu, Yingying ; Yin, Shan ; Jia, Yujie ; Yu, Bo ; Brozek, Tomasz
Electron Devices Society, IEEE Journal of the, 2022, Vol.10, p.870-875
IEEE
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Motion Planning for Serial Mechanisms Based on Precurved Flexible Beams
Idelson, Yakov ; Medina, Oded
Access, IEEE, 2022, Vol.10, p.124979-124989
IEEE
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18
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A MOSFET-Based Method for Measuring Peak Kilovoltage (kVp) in Diagnostic X-Ray Beams
Cavalcanti, Francisco A ; Santos, Luiz A. P
Instrumentation and Measurement, IEEE Open Journal of, 2022, Vol.1, p.1-7
IEEE
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Cosserat Rod-Based Dynamic Modeling of Tendon-Driven Continuum Robots: A Tutorial
Janabi-Sharifi, Farrokh ; Jalali, Amir ; Walker, Ian D
Access, IEEE, 2021, Vol.9, p.68703-68719
IEEE
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Charged Particle Fluxes Associated With CALIPSO Low Laser Energy Shots
Rodriguez, J. V ; Verhappen, R. C ; Weimer, C ; Trepte, C. R ; Cayton, T. E
Nuclear Science, IEEE Transactions on, 2022, Vol.69, p.2146-2153
IEEE
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