Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Artigo
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Distributed Optical Fiber Radiation Sensing in the Proton Synchrotron Booster at CERNDi Francesca, D. ; Toccafondo, I. ; Li Vecchi, G. ; Calderini, S. ; Girard, S. ; Alessi, A. ; Ferraro, R. ; Danzeca, S. ; Kadi, Y. ; Brugger, M.IEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1639-1644 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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2 |
Material Type: Artigo
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Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose EnvironmentsGoiffon, Vincent ; Rolando, Sebastien ; Corbiere, Franck ; Rizzolo, Serena ; Chabane, Aziouz ; Girard, Sylvain ; Baer, Jeremy ; Estribeau, Magali ; Magnan, Pierre ; Paillet, Philippe ; Van Uffelen, Marco ; Mont Casellas, Laura ; Scott, Robin ; Gaillardin, Marc ; Marcandella, Claude ; Marcelot, Olivier ; Allanche, TimotheIEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.45-53 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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3 |
Material Type: Artigo
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Displacement Damage in Silicon Detectors for High Energy PhysicsMoll, MichaelIEEE transactions on nuclear science, 2018-08, Vol.65 (8), p.1561-1582 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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4 |
Material Type: Artigo
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A New Technique Based on Convolutional Neural Networks to Measure the Energy of Protons and Electrons With a Single Timepix DetectorRuffenach, M. ; Bourdarie, S. ; Bergmann, B. ; Gohl, S. ; Mekki, J. ; Vaille, J.IEEE transactions on nuclear science, 2021-08, Vol.68 (8), p.1746-1753 [Periódico revisado por pares]IEEETexto completo disponível |
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5 |
Material Type: Artigo
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GREEN Upper Envelope Model for Energetic ElectronsSicard, A. ; Maget, V. ; Lazaro, D. ; Balcon, N. ; Ecoffet, R.IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1533-1540 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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6 |
Material Type: Artigo
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Radiation Damage in Silicon Photonic Mach-Zehnder Modulators and PhotodiodesZeiler, Marcel ; El Nasr-Storey, Sarah Seif ; Detraz, Stephane ; Kraxner, Andrea ; Olantera, Lauri ; Scarcella, Carmelo ; Sigaud, Christophe ; Soos, Csaba ; Troska, Jan ; Vasey, FrancoisIEEE transactions on nuclear science, 2017-11, Vol.64 (11), p.2794-2801 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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7 |
Material Type: Artigo
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In Situ Optical Characterization of Bulk Optical Glasses Under Protons and X-RaysAllanche, T. ; Morana, A. ; Paillet, P. ; Duhamel, O. ; Lambert, D. ; Meyer, A. ; Hoehr, C. ; Belanger-Champagne, C. ; Trinczek, M. ; Muller, C. ; Ouerdane, Y. ; Boukenter, A. ; Girard, S.IEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1492-1499 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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8 |
Material Type: Artigo
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Temperature Dependence of Radiation Induced Attenuation of Aluminosilicate Optical FiberCampanella, Cosimo ; De Michele, Vincenzo ; Morana, Adriana ; Guttilla, Angela ; Mady, Frank ; Benabdesselam, Mourad ; Marin, Emmanuel ; Boukenter, Aziz ; Ouerdane, Youcef ; Girard, SylvainIEEE transactions on nuclear science, 2022-07, Vol.69 (7), p.1515-1520 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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9 |
Material Type: Artigo
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Silicon Carbide Neutron Detectors for Harsh Nuclear Environments: A Review of the State of the ArtRuddy, Frank H. ; Ottaviani, Laurent ; Lyoussi, Abdallah ; Destouches, Christophe ; Palais, Olivier ; Reynard-Carette, ChristelleIEEE transactions on nuclear science, 2022-04, Vol.69 (4), p.792-803 [Periódico revisado por pares]New York: IEEETexto completo disponível |
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10 |
Material Type: Artigo
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Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose TestsGoiffon, Vincent ; Corbiere, Franck ; Rolando, Sebastien ; Estribeau, Magali ; Magnan, Pierre ; Avon, Barbara ; Baer, Jeremy ; Gaillardin, Marc ; Molina, Romain ; Paillet, Philippe ; Girard, Sylvain ; Chabane, Aziouz ; Cervantes, Paola ; Marcandella, ClaudeIEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2956-2964 [Periódico revisado por pares]New York: IEEETexto completo disponível |