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Refinado por: Base de dados/Biblioteca: Aluminium Industry Abstracts remover Nome da Publicação: Ieee Transactions On Nuclear Science remover idioma: Japonês remover
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Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments
Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments
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Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments

Goiffon, Vincent ; Rolando, Sebastien ; Corbiere, Franck ; Rizzolo, Serena ; Chabane, Aziouz ; Girard, Sylvain ; Baer, Jeremy ; Estribeau, Magali ; Magnan, Pierre ; Paillet, Philippe ; Van Uffelen, Marco ; Mont Casellas, Laura ; Scott, Robin ; Gaillardin, Marc ; Marcandella, Claude ; Marcelot, Olivier ; Allanche, Timothe

IEEE transactions on nuclear science, 2017-01, Vol.64 (1), p.45-53 [Periódico revisado por pares]

New York: IEEE

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2
Radiation Shielding Evaluation of Spacecraft Walls Against Heavy Ions Using Microdosimetry
Radiation Shielding Evaluation of Spacecraft Walls Against Heavy Ions Using Microdosimetry
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Radiation Shielding Evaluation of Spacecraft Walls Against Heavy Ions Using Microdosimetry

Peracchi, Stefania ; James, Benjamin ; Pagani, Federico ; Pan, Vladimir ; Vohradsky, James ; Bolst, David ; Prokopovich, Dale Anthony ; Guatelli, Susanna ; Petasecca, Marco ; Lerch, Michael L. F. ; Lee, Sung Hyun ; Inaniwa, Taku ; Matsufuji, Naruhiro ; Povoli, Marco ; Kok, Angela ; Jackson, Michael ; Squire, Timothy ; Rosenfeld, Anatoly B. ; Tran, Linh T.

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.897-905 [Periódico revisado por pares]

New York: IEEE

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3
Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage
Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage
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Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage

Kobayashi, Daisuke ; Hayashi, Naoki ; Hirose, Kazuyuki ; Kakehashi, Yuya ; Kawasaki, Osamu ; Makino, Takahiro ; Ohshima, Takeshi ; Matsuura, Daisuke ; Mori, Yoshiharu ; Kusano, Masaki ; Narita, Takanori ; Ishii, Shigeru ; Masukawa, Kazunori

IEEE transactions on nuclear science, 2019-01, Vol.66 (1), p.155-162 [Periódico revisado por pares]

New York: IEEE

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4
Investigation of Buried-Well Potential Perturbation Effects on SEU in SOI DICE-Based Flip-Flop Under Proton Irradiation
Investigation of Buried-Well Potential Perturbation Effects on SEU in SOI DICE-Based Flip-Flop Under Proton Irradiation
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Investigation of Buried-Well Potential Perturbation Effects on SEU in SOI DICE-Based Flip-Flop Under Proton Irradiation

Sakamoto, Keita ; Baba, Shunsuke ; Kobayashi, Daisuke ; Okamoto, Shogo ; Shindou, Hiroyuki ; Kawasaki, Osamu ; Makino, Takahiro ; Mori, Yoshiharu ; Matuura, Daisuke ; Kusano, Masaki ; Narita, Takanori ; Ishii, Shigeru ; Hirose, Kazuyuki

IEEE transactions on nuclear science, 2021-06, Vol.68 (6), p.1222-1227 [Periódico revisado por pares]

New York: IEEE

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5
Electron, Neutron, and Proton Irradiation Effects on SiC Radiation Detectors
Electron, Neutron, and Proton Irradiation Effects on SiC Radiation Detectors
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Electron, Neutron, and Proton Irradiation Effects on SiC Radiation Detectors

Rafi, Joan Marc ; Pellegrini, Giulio ; Godignon, Philippe ; Ugobono, Sofia Otero ; Rius, Gemma ; Tsunoda, Isao ; Yoneoka, Masashi ; Takakura, Kenichiro ; Kramberger, Gregor ; Moll, Michael

IEEE transactions on nuclear science, 2020-12, Vol.67 (12), p.2481-2489 [Periódico revisado por pares]

New York: IEEE

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6
Data Exploitation of New Galileo Environmental Monitoring Units
Data Exploitation of New Galileo Environmental Monitoring Units
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Data Exploitation of New Galileo Environmental Monitoring Units

Sandberg, I. ; Aminalragia-Giamini, S. ; Provatas, G. ; Hands, A. ; Ryden, K. ; Heynderickx, D. ; Tsigkanos, A. ; Papadimitriou, C. ; Nagatsuma, T. ; Evans, H. ; Rodgers, D.

IEEE transactions on nuclear science, 2019-07, Vol.66 (7), p.1761-1769 [Periódico revisado por pares]

New York: IEEE

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7
Radiation-Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory
Radiation-Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory
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Radiation-Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory

Kumari, Preeti ; Surendranathan, Umeshwarnath ; Wasiolek, Maryla ; Hattar, Khalid ; Bhat, Narayana P. ; Ray, Biswajit

IEEE transactions on nuclear science, 2021-05, Vol.68 (5), p.1032-1039 [Periódico revisado por pares]

New York: IEEE

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8
Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests
Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests
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Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests

Goiffon, Vincent ; Corbiere, Franck ; Rolando, Sebastien ; Estribeau, Magali ; Magnan, Pierre ; Avon, Barbara ; Baer, Jeremy ; Gaillardin, Marc ; Molina, Romain ; Paillet, Philippe ; Girard, Sylvain ; Chabane, Aziouz ; Cervantes, Paola ; Marcandella, Claude

IEEE transactions on nuclear science, 2015-12, Vol.62 (6), p.2956-2964 [Periódico revisado por pares]

New York: IEEE

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9
Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets
Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets
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Heavy-Ion Soft Errors in Back-Biased Thin-BOX SOI SRAMs: Hundredfold Sensitivity Due to Line-Type Multicell Upsets

Kobayashi, Daisuke ; Hirose, Kazuyuki ; Ito, Taichi ; Kakehashi, Yuya ; Kawasaki, Osamu ; Makino, Takahiro ; Ohshima, Takeshi ; Matsuura, Daisuke ; Narita, Takanori ; Kato, Masahiro ; Ishii, Shigeru ; Masukawa, Kazunori

IEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.523-532 [Periódico revisado por pares]

New York: IEEE

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10
Extreme Atmospheric Radiation Environments and Single Event Effects
Extreme Atmospheric Radiation Environments and Single Event Effects
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Extreme Atmospheric Radiation Environments and Single Event Effects

Dyer, Clive ; Hands, Alex ; Ryden, Keith ; Lei, Fan

IEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.432-438 [Periódico revisado por pares]

New York: IEEE

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