Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Ata de Congresso
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A transient based approach to diagnose high impedance faults on smart distribution networksLopes, F. V. ; Santos, W. C. ; Fernandes, D. ; Neves, W. L. A. ; Brito, N. S. D. ; Souza, B. A.2013 IEEE PES Conference on Innovative Smart Grid Technologies (ISGT Latin America), 2013, p.1-8IEEETexto completo disponível |
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2 |
Material Type: Ata de Congresso
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The Environmental Pollutant Bisphenol A Interferes with Nucleolar StructureRibeiro-Varandas, E. ; Pereira, H. S. ; Monteiro, S. ; Ferreira, R. B. ; Neves, E. ; Brito, L. ; Viegas, W. ; Delgado, M.2012 International Conference on Biomedical Engineering and Biotechnology, 2012, p.1811-1814IEEETexto completo disponível |
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3 |
Material Type: Ata de Congresso
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Comparison between backpropagation and RPROP algorithms applied to fault classification in transmission linesSouza, B.A. ; Brito, N.S.D. ; Neves, W.L.A. ; Silva, K.M. ; Lima, R.B.V. ; da Silva, S.S.B.2004 IEEE International Joint Conference on Neural Networks (IEEE Cat. No.04CH37541), 2004, Vol.4, p.2913-2918 vol.4Piscataway NJ: IEEETexto completo disponível |
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4 |
Material Type: Ata de Congresso
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Sampling rate of digital fault recorders influence on fault diagnosisNeves, W.L.A. ; Brito, N.S.D. ; Souza, B.A. ; Fontes, A.V. ; Dantas, K.M.C. ; Fernandes, A.B. ; Silva, S.S.B.2004 IEEE/PES Transmision and Distribution Conference and Exposition: Latin America (IEEE Cat. No. 04EX956), 2004, p.406-411IEEETexto completo disponível |
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5 |
Material Type: Ata de Congresso
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Transmission line model influence on fault diagnosisBrito, N.S.D. ; Neves, W.L.A. ; Souza, B.A. ; Dantas, K.M.C. ; Fontes, A.V. ; Fernandes, A.B. ; Silva, S.S.B.2004 IEEE/PES Transmision and Distribution Conference and Exposition: Latin America (IEEE Cat. No. 04EX956), 2004, p.412-417IEEETexto completo disponível |
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6 |
Material Type: Ata de Congresso
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Combined approach to fault diagnosis based on principal components and influence matrixPalma, L.B. ; Coito, F.V. ; da Silva, R.N.IEEE International Workshop on Intelligent Signal Processing, 2005, 2005, p.171-176IEEETexto completo disponível |