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1 |
Material Type: Livro
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Mechanics and electrodynamicsL. D. Landau 1908-1968 (Lev Davidovich) E. M Lifshiëtìs (Evgeniæi Mikhaæilovich)New York Pergamon Press (1972)Localização: IF - Instituto de Física (530.1 L253s v.1 )(Acessar) |
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2 |
Material Type: Livro
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Statistical physics and the atomic theory of matter from Boyle and Newton to Landau and OnsagerStephen G. BrushPrinceton, N.J. Princeton University Press c1983Localização: IF - Instituto de Física (530.13 B912s ex.2 Biblioteca do Prof. Ivan Ventura ) e outros locais(Acessar) |
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3 |
Material Type: Livro
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Engineering Damage Mechanics: Ductile, Creep, Fatigue and Brittle FailuresLemaitre, Jean ; Desmorat, RodrigueBerlin, Heidelberg: Springer Berlin / Heidelberg 2005Sem texto completo |
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4 |
Material Type: Livro
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Identification of Damage Using Lamb Waves: From Fundamentals to ApplicationsSu, Zhongqing ; Ye, LinLondon: Springer London, Limited 2009Sem texto completo |
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5 |
Material Type: Livro
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Terminal BallisticsRosenberg, Zvi ; Dekel, ErezBerlin, Heidelberg: Springer-Verlag 2012Sem texto completo |
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6 |
Material Type: Livro
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Metal Oxide Nanoparticles in Organic Solvents: Synthesis, Formation, Assembly and ApplicationNiederberger, Markus ; Pinna, NicolaLondon: Springer London, Limited 2009Sem texto completo |
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7 |
Material Type: Livro
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Handbook of Contact Mechanics: Exact Solutions of Axisymmetric Contact ProblemsPopov, Valentin L ; Heß, Markus ; Willert, EmanuelBerlin, Heidelberg: Springer Nature 2019Texto completo disponível |
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8 |
Material Type: Livro
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Computational Contact MechanicsWriggers, PeterBerlin, Heidelberg: Springer-Verlag 2006Sem texto completo |
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9 |
Material Type: Livro
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Contact Mechanics and Friction: Physical Principles and ApplicationsPopov, Valentin LBerlin, Heidelberg: Springer-Verlag 2010Sem texto completo |
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10 |
Material Type: Livro
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High-Entropy Alloys: Fundamentals and ApplicationsGao, Michael C ; Yeh, Jien-Wei ; Liaw, Peter K ; Zhang, Yong Gao, Michael C. ; Liaw, Peter K. ; Zhang, Yong ; Yeh, Jien-WeiCham: Springer International Publishing AG 2016Sem texto completo |