Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Article
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Visual Object Tracking Based on Local Steering Kernels and Color HistogramsZoidi, O. ; Tefas, A. ; Pitas, I.IEEE transactions on circuits and systems for video technology, 2013-05, Vol.23 (5), p.870-882 [Peer Reviewed Journal]New York, NY: IEEEFull text available |
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2 |
Material Type: Article
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Minimum Class Variance Extreme Learning Machine for Human Action RecognitionIosifidis, Alexandros ; Tefas, Anastasios ; Pitas, IoannisIEEE transactions on circuits and systems for video technology, 2013-11, Vol.23 (11), p.1968-1979 [Peer Reviewed Journal]New York, NY: IEEEFull text available |
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3 |
Material Type: Article
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Positive and Negative Label PropagationsZoidi, Olga ; Tefas, Anastasios ; Nikolaidis, Nikos ; Pitas, IoannisIEEE transactions on circuits and systems for video technology, 2018-02, Vol.28 (2), p.342-355 [Peer Reviewed Journal]New York: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)Full text available |
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4 |
Material Type: Article
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Combining Fuzzy Vector Quantization With Linear Discriminant Analysis for Continuous Human Movement RecognitionGkalelis, N. ; Tefas, A. ; Pitas, I.IEEE transactions on circuits and systems for video technology, 2008-11, Vol.18 (11), p.1511-1521 [Peer Reviewed Journal]New York: IEEEFull text available |
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5 |
Material Type: Article
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Combining Fuzzy Vector Quantization With Linear Discriminant Analysis for Continuous Human Movement Recognition: Special Issue on Event Analysis in VideosGKALELIS, Nikolaos ; TEFAS, Anastasios ; PITAS, IoannisIEEE transactions on circuits and systems for video technology, 2008, Vol.18 (11), p.1511-1521 [Peer Reviewed Journal]New York, NY: Institute of Electrical and Electronics EngineersFull text available |
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6 |
Material Type: Article
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Automated Facial Pose Extraction From Video Sequences Based on Mutual InformationGoudelis, G. ; Tefas, A. ; Pitas, I.IEEE transactions on circuits and systems for video technology, 2008-03, Vol.18 (3), p.418-424 [Peer Reviewed Journal]New York, NY: IEEEFull text available |