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Effect of a High Density of Stacking Faults on the Young’s Modulus of GaAs Nanowires

Chen, Yujie ; Burgess, Tim ; An, Xianghai ; Mai, Yiu-Wing ; Tan, H. Hoe ; Zou, Jin ; Ringer, Simon P ; Jagadish, Chennupati ; Liao, Xiaozhou

Nano letters, 2016-03, Vol.16 (3), p.1911-1916 [Peer Reviewed Journal]

United States: American Chemical Society

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