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A method for measuring the shape of a surface of an ellipsoid of rotation on a Talysurf CCI 2000 interference microscope

Akhsakhalyan, A. ; Akhsakhalyan, A. ; Zorina, M. ; Kharitonov, A.

Bulletin of the Russian Academy of Sciences: Physics, 2011, Vol.75(1), pp.97-99 [Periódico revisado por pares]

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  • Título:
    A method for measuring the shape of a surface of an ellipsoid of rotation on a Talysurf CCI 2000 interference microscope
  • Autor: Akhsakhalyan, A. ; Akhsakhalyan, A. ; Zorina, M. ; Kharitonov, A.
  • Assuntos: Physics ; Nuclear Physics, Heavy Ions, Hadrons ; Physics
  • É parte de: Bulletin of the Russian Academy of Sciences: Physics, 2011, Vol.75(1), pp.97-99
  • Descrição: A method for measuring the shape of the surface of an ellipsoid of rotation on a Talysurf CCI 2000 white-light scanning interference microscope is presented. The measurement results are compared to alternative measurements. It is shown that the measurement results are quite consistent.
  • Idioma: Inglês

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