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Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3

Ota, Y ; Sakuma, J ; Kimura, Y ; Michikami, O

Physica C: Superconductivity and its applications, 01 October 2006, Vol.445-448, pp.849-852 [Periódico revisado por pares]

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  • Título:
    Relationship between superconducting properties of EuBa2Cu3O7 thin films and surface morphology of CeO2 buffer layers on R-Al2O3
  • Autor: Ota, Y ; Sakuma, J ; Kimura, Y ; Michikami, O
  • Assuntos: Euba2cu3o7 ; Ceo2 ; Critical Current Density ; 74.76.Bz ; Euba2cu3o7 ; Ceo2 ; Critical Current Density ; Physics
  • É parte de: Physica C: Superconductivity and its applications, 01 October 2006, Vol.445-448, pp.849-852
  • Descrição: We examined the effects of off-center distance (Doff) between the substrate and CeO2 target on surface morphology and crystallinity of 300-nm-thick CeO2 buffer layers and on superconducting properties of EBCO thin films. The surface roughness (Rz) of the CeO2 buffer layer rapidly increased with an increase in Doff. The orientation of an EBCO thin film was dependent on Doff of the buffer layer. At Doff=0–30mm, only (00l) peaks of an EBCO thin film were observed by X-ray diffraction patterns. At Doff values over 40mm, (110) or (103) peaks in addition to (00l) peaks were observed. At Doff=30mm, EBCO thin films exhibited critical temperatures (Tce) of approximately 89K and critical current densities (Jc) of 3.5MA/cm2 at 77.3K.
  • Idioma: Inglês

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