Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography

Medeiros, João M. ; Böck, Désirée ; Weiss, Gregor L. ; Kooger, Romain ; Wepf, Roger A. ; Pilhofer, Martin

Ultramicroscopy, 2018-07, Vol.190, p.1-11 [Periódico revisado por pares]

Netherlands: Elsevier B.V

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