The LVD experiment data acquisition system

Fulgione, W. ; Trinchero, G.C. ; Mayes, B. ; Pinsky, L. ; Haridas, P.

IEEE (Institute of Electrical and Electronics Engineers) Transactions on Nuclear Science; (USA), 1989-10, Vol.36 (5), p.1635-1638 [Periódico revisado por pares]

United States: IEEE

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