Electric field effects on force curves for oxidized silicon tips and ice surfaces in a controlled environment

Slaughterbeck, C. R. ; Kukes, E. W. ; Pittenger, B. ; Cook, D. J. ; Williams, P. C. ; Eden, V. L. ; Fain, S. C.

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1996-05, Vol.14 (3), p.1213-1218 [Periódico revisado por pares]

Texto completo disponível