Direct sampling of electric-field vacuum fluctuations

Riek, C. ; Seletskiy, D. V. ; Moskalenko, A. S. ; Schmidt, J. F. ; Krauspe, P. ; Eckart, S. ; Eggert, S. ; Burkard, G. ; Leitenstorfer, A.

Science (American Association for the Advancement of Science), 2015-10, Vol.350 (6259), p.420-423 [Periódico revisado por pares]

United States: American Association for the Advancement of Science

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