Degradation processes of 280 nm high power DUV LEDs: impact on parasitic luminescence

Trivellin, Nicola ; Monti, Desiree ; Piva, Francesco ; Buffolo, Matteo ; De Santi, Carlo ; Zanoni, Enrico ; Meneghesso, Gaudenzio ; Meneghini, Matteo

Japanese Journal of Applied Physics, 2019-06, Vol.58 (SC), p.SCCC19 [Periódico revisado por pares]

Tokyo: IOP Publishing

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