Probing of Optical Near-Fields by Electron Rescattering on the 1 nm Scale
Thomas, Sebastian ; Krüger, Michael ; Förster, Michael ; Schenk, Markus ; Hommelhoff, Peter
Nano letters, 2013-10, Vol.13 (10), p.4790-4794 [Periódico revisado por pares]Washington, DC: American Chemical Society
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