[0 0 1] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(0 0 1)
Liao, X.Z ; Zou, J ; Cockayne, D.J.H ; Matsumura, S
Ultramicroscopy, 2004, Vol.98 (2), p.239-247
[Periódico revisado por pares]
Netherlands: Elsevier B.V
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