Polarization-induced remote interfacial charge scattering in Al 2 O 3 /AlGaN/GaN double heterojunction high electron mobility transistors
Ji, Dong ; Liu, Bing ; Lu, Yanwu ; Liu, Guipeng ; Zhu, Qinsheng ; Wang, Zhanguo
Applied physics letters, 2012-03, Vol.100 (13), p.132105-132105-4 [Periódico revisado por pares]American Institute of Physics
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