Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation

Rui Gao ; Manut, Azrif B. ; Zhigang Ji ; Jigang Ma ; Meng Duan ; Jian Fu Zhang ; Franco, Jacopo ; Hatta, Sharifah Wan Muhamad ; Wei Dong Zhang ; Kaczer, Ben ; Vigar, David ; Linten, Dimitri ; Groeseneken, Guido

IEEE transactions on electron devices, 2017-04, Vol.64 (4), p.1467-1473 [Periódico revisado por pares]

IEEE

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