The use of a Ga+ focused ion beam to modify graphene for device applications

Archanjo, B S ; Barboza, A P M ; Neves, B R A ; Malard, L M ; Ferreira, E H M ; Brant, J C ; Alves, E S ; Plentz, F ; Carozo, V ; Fragneaud, B ; Maciel, I O ; Almeida, C M ; Jorio, A ; Achete, C A

Nanotechnology, 2012-06, Vol.23 (25), p.255305-255305 [Periódico revisado por pares]

England: IOP Publishing

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