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Electron Backscatter Diffraction in Materials Science

Schwartz, Adam J ; Adams, Brent L ; Field, David P ; Kumar, Mukul Kumar, Mukul ; Field, David P. ; Schwartz, Adam J. ; Adams, Brent L.

New York, NY: Springer-Verlag 2009

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  • Título:
    Electron Backscatter Diffraction in Materials Science
  • Autor: Schwartz, Adam J ; Adams, Brent L ; Field, David P ; Kumar, Mukul
  • Kumar, Mukul ; Field, David P. ; Schwartz, Adam J. ; Adams, Brent L.
  • Assuntos: Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Condensed Matter Physics ; Crystallography ; Geophysics/Geodesy ; Materials ; Materials Science ; Materials Science, general ; Scanning electron microscopy ; Surfaces (Physics)
  • Descrição: Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors. The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics. TOC:Development of Automated Diffration in SEM and TEM / theoretical framework for EBSD / representation of texture in orientation space / fundamentals of automated EBSD / phase identification using EBSD / 3D orientation imaging / EBSD - buying a system / hardware and software optimization / advanced software capabilities for automated EBSD / EBSD of ceramic materials / and more.
  • Editor: New York, NY: Springer-Verlag
  • Data de criação/publicação: 2009
  • Formato: 406
  • Idioma: Inglês
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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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