Micromanipulation and Pick-Up System for X-Ray Diffraction Characterization of Micrometer-Sized Single Particles

Takeichi, Y ; Inami, N ; Ueno, T ; Saito, K ; Otori, H ; Sagayama, R ; Kumai, R ; Ono, K

Journal of physics. Conference series, 2014-01, Vol.502 (1), p.12008-4 [Periódico revisado por pares]

Bristol: IOP Publishing

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