Adhesion forces for mica and silicon oxide surfaces studied by atomic force spectroscopy

F. L. Leite Ervino Carlos Ziemath; Osvaldo Novais de Oliveira Junior; P. S. P Herrmann; Latin American Symposium on Scanning Probe Microscopy - LASPM (3. 2005 Ouro Preto)

Microscopy and Microanalysis Cambridge University Press v. 11, supl. S03, p. 130-133, Dec. 2005

New York Cambridge University Press 2005

Localização: IFSC - Inst. Física de São Carlos    (PROD011943 ) e outros locais(Acessar)