A 100-ps time-resolution CMOS time-to-digital converter for positron emission tomography imaging applications

Swann, B.K. ; Blalock, B.J. ; Clonts, L.G. ; Binkley, D.M. ; Rochelle, J.M. ; Breeding, E. ; Baldwin, K.M.

IEEE journal of solid-state circuits, 2004-11, Vol.39 (11), p.1839-1852 [Periódico revisado por pares]

New York, NY: IEEE

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