Interface roughness scattering considering the electrical field fluctuation in undoped AlxGa1−xN GaN heterostructures
Feng, Yuxia ; Liu, Guipeng ; Yang, Shaoyan ; Wei, Hongyuan ; Liu, Xianglin ; Zhu, Qinsheng ; Wang, Zhanguo
Semiconductor science and technology, 2014-02, Vol.29 (4), p.045015 [Periódico revisado por pares]IOP Publishing
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