Electrical and transient current characterization of edgeless Si detectors diced with different methods
Zheng Li ; Abreu, M. ; Eremin, V. ; Granata, V. ; Mariano, J. ; Mendes, P.R. ; Niinikoski, T.O. ; Sousa, P. ; Verbitskaya, E. ; Zhang, W.
IEEE transactions on nuclear science, 2002-06, Vol.49 (3), p.1040-1046 [Periódico revisado por pares]New York: IEEE
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