Argon 420.1-419.8 nm emission line ratio for measuring plasma effective electron temperatures

Boffard, John B ; Jung, R O ; Lin, Chun C ; Aneskavich, L E ; Wendt, A E

Journal of physics. D, Applied physics, 2012-02, Vol.45 (4), p.045201-1-11 [Periódico revisado por pares]

IOP Publishing

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