Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy

Huang, Xiaojing ; Miao, Huijie ; Steinbrener, Jan ; Nelson, Johanna ; Shapiro, David ; Stewart, Andrew ; Turner, Joshua ; Jacobsen, Chris

Optics express, 2009-08, Vol.17 (16), p.13541-13553 [Periódico revisado por pares]

United States: Optical Society of America (OSA)

Texto completo disponível