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Magnetic Properties and Giant Magnetoimpedance of FeNi-Based Nanostructured Multilayers With Variable Thickness of the Central Cu Lead

Volchkov, S. O. ; Fernandez, E. ; Garcia-Arribas, A. ; Barandiaran, J. M. ; Lepalovskij, V. N. ; Kurlyandskaya, G. V.

IEEE transactions on magnetics, 2011-10, Vol.47 (10), p.3328-3331

New York, NY: IEEE

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  • Título:
    Magnetic Properties and Giant Magnetoimpedance of FeNi-Based Nanostructured Multilayers With Variable Thickness of the Central Cu Lead
  • Autor: Volchkov, S. O. ; Fernandez, E. ; Garcia-Arribas, A. ; Barandiaran, J. M. ; Lepalovskij, V. N. ; Kurlyandskaya, G. V.
  • Assuntos: Copper ; Magnetic hysteresis ; Magnetic multilayers ; Magnetization processes ; magnetoimpedance ; Nonhomogeneous media ; Perpendicular magnetic anisotropy ; Sensitivity ; thin films
  • É parte de: IEEE transactions on magnetics, 2011-10, Vol.47 (10), p.3328-3331
  • Descrição: The magnetoimpedance effect is attractive for thin film-based magnetic sensor applications. Recently a significant progress has been made in the development of appropriate theories, preparation and characterization of MI thin film-based structures. In the present work FeNi(100 nm)/Cu(3.2 nm)] 4 /FeNi(100 nm)/Cu(L Cu )/[FeNi(100 nm)/Cu(3.2 nm)] 4 /FeNi(100 nm) multilayered structures with open magnetic flux have been prepared by RF-sputtering. Their magnetic properties and MI were studied as a function of the thickness of the central Cu lead. It was shown that the thickness of the Cu lead is an important parameter. The highest sensitivity (≈ 50%/Oe, f=160 MHz) was observed for the sample with a central Cu layer thickness of about a half-thickness of a magnetic layer (L Cu ≈ 250 nm). The maximum sensitivity of the real part of the impedance was also obtained for this thickness (≈ 75%/Oe).
  • Editor: New York, NY: IEEE
  • Idioma: Inglês;Russo
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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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