AM-SegNet for additive manufacturing in situ X-ray image segmentation and feature quantification
Li, Wei ; Lambert-Garcia, Rubén ; Getley, Anna CM ; Kim, Kwan ; Bhagavath, Shishira ; Majkut, Marta ; Rack, Alexander ; Lee, Peter D ; Leung, Chu Lun Alex
Informa UK Limited 2024-12
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