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Advances in X-ray analysis Volume 32

C. S Barrett 1902- (Charles Sanborn); University of Denver Dept. of Engineering; JCPDS--International Centre for Diffraction Data; Conference on Applications of X-ray Analysis (37th 1988 Steamboat Springs, Colo.)

New York Plenum Press c1989

Localização: EEL - Engenharia de Materiais    (543.42 B274a ) e outros locais(Acessar)

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