DEEP: Developing Extremely Efficient Runtime On-Chip Power Meters
Xie, Zhiyao ; Li, Shiyu ; Ma, Mingyuan ; Chang, Chen-Chia ; Pan, Jingyu ; Chen, Yiran ; Hu, Jiang
2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 2022, p.1-9
New York, NY, USA: ACM
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